Journal Article

PUBDB-2025-01329

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Resistively detected electron spin resonance and g- factor in few-layer exfoliated MoS$_2$ devices

Sharma, C. H. (Corresponding author)Extern*XFEL.EU* ; Parvangada, A. ; Tiemann, L.CFEL*MPG* ; Rossnagel, K.DESY* ; Martin, J. ; Blick, R. H.Extern*

2025
IOP Publ. Bristol

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Please use a persistent id in citations: doi:10.1088/1361-648X/adc35d  doi:10.3204/PUBDB-2025-01329

Report No.: arXiv:2410.18758

Abstract: MoS$_2$ has recently emerged as a promising material for enabling quantum devices and spintronic applications. In this context, an improved physical understanding of the g-factor of MoS$_2$ depending on device geometry is of great importance. Resistively detected electron spin resonance (RD-ESR) could be employed to determine the g-factor in micron-scale devices. However, its application and RD-ESR studies have been limited by Schottky or high-resistance contacts to MoS$_2$. Here, we exploit naturally n-doped few-layer MoS$_2$ devices with ohmic tin (Sn) contacts that allow the electrical study of spin phenomena. Resonant excitation of electron spins and resistive detection is a possible path to exploit the spin effects in MoS$_2$ devices. Using RD-ESR, we determine the g-factor of few-layer MoS$_2$ to be ∼1.92 and observe that the g-factor value is independent of the charge carrier density within the limits of our measurements.

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Contributing Institute(s):

1. FS-SXQM (FS-SXQM)

Research Program(s):

1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)
2. AIM, DFG project G:(GEPRIS)390715994 - EXC 2056: CUI: Advanced Imaging of Matter (390715994) (390715994)

Experiment(s):

1. No specific instrument

Appears in the scientific report 2025

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Physical, Chemical and Earth Sciences ; Essential Science Indicators ; IF < 5 ; JCR ; National-Konsortium ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection

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Linked articles:

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Preprint Sharma, C. (Corresponding author)Extern*XFEL.EU* ; Parvangada, A. ; Tiemann, L. ; Rossnagel, K.DESY* ; Martin, J. ; Blick, R. H.
Resistively detected electron spin resonance and g- factor in few-layer exfoliated MoS$_2$ devices
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