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@ARTICLE{Sharma:626429,
author = {Sharma, Chithra and Parvangada, Appanna and Tiemann, Lars
and Rossnagel, Kai and Martin, Jens and Blick, Robert H},
title = {{R}esistively detected electron spin resonance and g-
factor in few-layer exfoliated {M}o{S}$_2$ devices},
reportid = {PUBDB-2025-01408, arXiv:2410.18758},
year = {2025},
note = {4 figures, 7 pages},
abstract = {MoS$_2$ has recently emerged as a promising material for
enabling quantum devices and spintronic applications. In
this context, an improved physical understanding of the
g-factor of MoS$_2$ depending on device geometry is of great
importance. Resistively detected electron spin resonance
(RD-ESR) could be employed to determine the g-factor in
micron-scale devices. However, its application and RD-ESR
studies have been limited by Schottky or high-resistance
contacts to MoS$_2$. Here, we exploit naturally n-doped
few-layer MoS$_2$ devices with ohmic tin (Sn) contacts that
allow the electrical study of spin phenomena. Resonant
excitation of electron spins and resistive detection is a
possible path to exploit the spin effects in MoS$_2$
devices. Using RD-ESR, we determine the g-factor of
few-layer MoS$_2$ to be ∼1.92 and observe that the
g-factor value is independent of the charge carrier density
within the limits of our measurements.},
cin = {FS-SXQM},
ddc = {530},
cid = {I:(DE-H253)FS-SXQM-20190201},
pnm = {632 - Materials – Quantum, Complex and Functional
Materials (POF4-632) / AIM, DFG project G:(GEPRIS)390715994
- EXC 2056: CUI: Advanced Imaging of Matter (390715994)},
pid = {G:(DE-HGF)POF4-632 / G:(GEPRIS)390715994},
experiment = {EXP:(DE-MLZ)NOSPEC-20140101},
typ = {PUB:(DE-HGF)25},
eprint = {2410.18758},
howpublished = {arXiv:2410.18758},
archivePrefix = {arXiv},
SLACcitation = {$\%\%CITATION$ = $arXiv:2410.18758;\%\%$},
pubmed = {pmid:40112452},
url = {https://bib-pubdb1.desy.de/record/626429},
}