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Journal Article | PUBDB-2023-06750 |
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2023
Inst.
Woodbury, NY
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Please use a persistent id in citations: doi:10.1103/PhysRevA.107.053503 doi:10.3204/PUBDB-2023-06750
Report No.: arXiv:2203.00688
Abstract: We demonstrate a simple and robust high-resolution ghost spectroscopy approach for x-ray and extreme ultraviolet transient absorption spectroscopy at free-electron laser sources. To retrieve the sample response, our approach requires only an online spectrometer before the sample and a downstream bucket detector. We validate the method by measuring the absorption spectrum of silicon, silicon carbide, and silicon nitride membranes in the vicinity of the silicon L$_{2,3}$ edge and by comparing the results with standard techniques for absorption measurements. Moreover, we show that ghost spectroscopy allows the high-resolution reconstruction of the sample spectral response to optical pumps using a coarse energy scan with self-amplified spontaneous emission radiation.
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High-spectral-resolution absorption measurements with free-electron lasers using ghost spectroscopy
[10.3204/PUBDB-2023-07652]
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