Journal Article PUBDB-2023-06750

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High-spectral-resolution absorption measurements with free-electron lasers using ghost spectroscopy

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2023
Inst. Woodbury, NY

Physical review / A 107(5), 053503 () [10.1103/PhysRevA.107.053503]
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Report No.: arXiv:2203.00688

Abstract: We demonstrate a simple and robust high-resolution ghost spectroscopy approach for x-ray and extreme ultraviolet transient absorption spectroscopy at free-electron laser sources. To retrieve the sample response, our approach requires only an online spectrometer before the sample and a downstream bucket detector. We validate the method by measuring the absorption spectrum of silicon, silicon carbide, and silicon nitride membranes in the vicinity of the silicon L$_{2,3}$ edge and by comparing the results with standard techniques for absorption measurements. Moreover, we show that ghost spectroscopy allows the high-resolution reconstruction of the sample spectral response to optical pumps using a coarse energy scan with self-amplified spontaneous emission radiation.

Classification:

Contributing Institute(s):
  1. FS-Photon Science (FS-PS)
  2. European XFEL Projekt Team (Eur.XFEL)
  3. The European XFEL Users (XFEL-User)
Research Program(s):
  1. 631 - Matter – Dynamics, Mechanisms and Control (POF4-631) (POF4-631)
Experiment(s):
  1. Measurement at external facility

Appears in the scientific report 2023
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High-spectral-resolution absorption measurements with free-electron lasers using ghost spectroscopy
[10.3204/PUBDB-2023-07652]  GO OpenAccess  Download fulltext Files  Download fulltextFulltext by arXiv.org BibTeX | EndNote: XML, Text | RIS


 Record created 2023-11-10, last modified 2025-07-15


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