TY  - JOUR
AU  - Klein, Yishai
AU  - Strizhevsky, Edward
AU  - Capotondi, Flavio
AU  - De Angelis, Dario
AU  - Giannessi, Luca
AU  - Pancaldi, Matteo
AU  - Pedersoli, Emanuele
AU  - Penco, Giuseppe
AU  - Prince, Kevin C.
AU  - Sefi, Or
AU  - Kim, Young Yong
AU  - Vartaniants, Ivan
AU  - Shwartz, Sharon
TI  - High-spectral-resolution absorption measurements with free-electron lasers using ghost spectroscopy
JO  - Physical review / A
VL  - 107
IS  - 5
SN  - 2469-9926
CY  - Woodbury, NY
PB  - Inst.
M1  - PUBDB-2023-06750
M1  - arXiv:2203.00688
SP  - 053503
PY  - 2023
AB  - We demonstrate a simple and robust high-resolution ghost spectroscopy approach for x-ray and extreme ultraviolet transient absorption spectroscopy at free-electron laser sources. To retrieve the sample response, our approach requires only an online spectrometer before the sample and a downstream bucket detector. We validate the method by measuring the absorption spectrum of silicon, silicon carbide, and silicon nitride membranes in the vicinity of the silicon L<sub>2,3</sub> edge and by comparing the results with standard techniques for absorption measurements. Moreover, we show that ghost spectroscopy allows the high-resolution reconstruction of the sample spectral response to optical pumps using a coarse energy scan with self-amplified spontaneous emission radiation.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000989811400001
DO  - DOI:10.1103/PhysRevA.107.053503
UR  - https://bib-pubdb1.desy.de/record/598139
ER  -