TY  - EJOUR
AU  - Klein, Yishai
AU  - Strizhevsky, Edward
AU  - Capotondi, Flavio
AU  - De Angelis, Dario
AU  - Giannessi, Luca
AU  - Pancaldi, Matteo
AU  - Pedersoli, Emanuele
AU  - Penco, Giuseppe
AU  - Prince, Kevin C.
AU  - Sefi, Or
AU  - Kim, Young Yong
AU  - Vartaniants, Ivan
AU  - Shwartz, Sharon
TI  - High-spectral-resolution absorption measurements with free-electron lasers using ghost spectroscopy
IS  - arXiv:2203.00688
M1  - PUBDB-2023-07652
M1  - arXiv:2203.00688
PY  - 2023
AB  - We demonstrate a simple and robust high-resolution ghost spectroscopy approach for x-ray and extreme ultraviolet transient absorption spectroscopy at free-electron laser sources. To retrieve the sample response, our approach requires only an online spectrometer before the sample and a downstream bucket detector. We validate the method by measuring the absorption spectrum of silicon, silicon carbide, and silicon nitride membranes in the vicinity of the silicon L2,3 edge and by comparing the results with standard techniques for absorption measurements. Moreover, we show that ghost spectroscopy allows the high-resolution reconstruction of the sample spectral response to optical pumps using a coarse energy scan with self-amplified spontaneous emission radiation.
LB  - PUB:(DE-HGF)25
DO  - DOI:10.3204/PUBDB-2023-07652
UR  - https://bib-pubdb1.desy.de/record/599963
ER  -