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000598139 1001_ $$aKlein, Yishai$$b0
000598139 245__ $$aHigh-spectral-resolution absorption measurements with free-electron lasers using ghost spectroscopy
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000598139 520__ $$aWe demonstrate a simple and robust high-resolution ghost spectroscopy approach for x-ray and extreme ultraviolet transient absorption spectroscopy at free-electron laser sources. To retrieve the sample response, our approach requires only an online spectrometer before the sample and a downstream bucket detector. We validate the method by measuring the absorption spectrum of silicon, silicon carbide, and silicon nitride membranes in the vicinity of the silicon L$_{2,3}$ edge and by comparing the results with standard techniques for absorption measurements. Moreover, we show that ghost spectroscopy allows the high-resolution reconstruction of the sample spectral response to optical pumps using a coarse energy scan with self-amplified spontaneous emission radiation.
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000598139 7001_ $$0P:(DE-H253)PIP1084124$$aStrizhevsky, Edward$$b1
000598139 7001_ $$0P:(DE-H253)PIP1007809$$aCapotondi, Flavio$$b2
000598139 7001_ $$aDe Angelis, Dario$$b3
000598139 7001_ $$aGiannessi, Luca$$b4
000598139 7001_ $$0P:(DE-H253)PIP1088020$$aPancaldi, Matteo$$b5
000598139 7001_ $$0P:(DE-H253)PIP1008690$$aPedersoli, Emanuele$$b6
000598139 7001_ $$aPenco, Giuseppe$$b7
000598139 7001_ $$0P:(DE-H253)PIP1091774$$aPrince, Kevin C.$$b8
000598139 7001_ $$aSefi, Or$$b9
000598139 7001_ $$0P:(DE-H253)PIP1015956$$aKim, Young Yong$$b10
000598139 7001_ $$0P:(DE-H253)PIP1003481$$aVartaniants, Ivan$$b11
000598139 7001_ $$0P:(DE-H253)PIP1085043$$aShwartz, Sharon$$b12$$eCorresponding author
000598139 773__ $$0PERI:(DE-600)2844156-4$$a10.1103/PhysRevA.107.053503$$gVol. 107, no. 5, p. 053503$$n5$$p053503$$tPhysical review / A$$v107$$x2469-9926$$y2023
000598139 7870_ $$0PUBDB-2023-07652$$aKlein, Yishai et.al.$$d2023$$iIsParent$$rarXiv:2203.00688$$tHigh-spectral-resolution absorption measurements with free-electron lasers using ghost spectroscopy
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