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@ARTICLE{Klein:598139,
author = {Klein, Yishai and Strizhevsky, Edward and Capotondi, Flavio
and De Angelis, Dario and Giannessi, Luca and Pancaldi,
Matteo and Pedersoli, Emanuele and Penco, Giuseppe and
Prince, Kevin C. and Sefi, Or and Kim, Young Yong and
Vartaniants, Ivan and Shwartz, Sharon},
title = {{H}igh-spectral-resolution absorption measurements with
free-electron lasers using ghost spectroscopy},
journal = {Physical review / A},
volume = {107},
number = {5},
issn = {2469-9926},
address = {Woodbury, NY},
publisher = {Inst.},
reportid = {PUBDB-2023-06750, arXiv:2203.00688},
pages = {053503},
year = {2023},
abstract = {We demonstrate a simple and robust high-resolution ghost
spectroscopy approach for x-ray and extreme ultraviolet
transient absorption spectroscopy at free-electron laser
sources. To retrieve the sample response, our approach
requires only an online spectrometer before the sample and a
downstream bucket detector. We validate the method by
measuring the absorption spectrum of silicon, silicon
carbide, and silicon nitride membranes in the vicinity of
the silicon L$_{2,3}$ edge and by comparing the results with
standard techniques for absorption measurements. Moreover,
we show that ghost spectroscopy allows the high-resolution
reconstruction of the sample spectral response to optical
pumps using a coarse energy scan with self-amplified
spontaneous emission radiation.},
cin = {FS-PS / Eur.XFEL / XFEL-User},
ddc = {530},
cid = {I:(DE-H253)FS-PS-20131107 / $I:(DE-H253)Eur_XFEL-20120731$
/ I:(DE-H253)XFEL-User-20170713},
pnm = {631 - Matter – Dynamics, Mechanisms and Control
(POF4-631)},
pid = {G:(DE-HGF)POF4-631},
experiment = {EXP:(DE-MLZ)External-20140101},
typ = {PUB:(DE-HGF)16},
eprint = {2203.00688},
howpublished = {arXiv:2203.00688},
archivePrefix = {arXiv},
SLACcitation = {$\%\%CITATION$ = $arXiv:2203.00688;\%\%$},
UT = {WOS:000989811400001},
doi = {10.1103/PhysRevA.107.053503},
url = {https://bib-pubdb1.desy.de/record/598139},
}