%0 Journal Article
%A Klein, Yishai
%A Strizhevsky, Edward
%A Capotondi, Flavio
%A De Angelis, Dario
%A Giannessi, Luca
%A Pancaldi, Matteo
%A Pedersoli, Emanuele
%A Penco, Giuseppe
%A Prince, Kevin C.
%A Sefi, Or
%A Kim, Young Yong
%A Vartaniants, Ivan
%A Shwartz, Sharon
%T High-spectral-resolution absorption measurements with free-electron lasers using ghost spectroscopy
%J Physical review / A
%V 107
%N 5
%@ 2469-9926
%C Woodbury, NY
%I Inst.
%M PUBDB-2023-06750
%M arXiv:2203.00688
%P 053503
%D 2023
%X We demonstrate a simple and robust high-resolution ghost spectroscopy approach for x-ray and extreme ultraviolet transient absorption spectroscopy at free-electron laser sources. To retrieve the sample response, our approach requires only an online spectrometer before the sample and a downstream bucket detector. We validate the method by measuring the absorption spectrum of silicon, silicon carbide, and silicon nitride membranes in the vicinity of the silicon L<sub>2,3</sub> edge and by comparing the results with standard techniques for absorption measurements. Moreover, we show that ghost spectroscopy allows the high-resolution reconstruction of the sample spectral response to optical pumps using a coarse energy scan with self-amplified spontaneous emission radiation.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000989811400001
%R 10.1103/PhysRevA.107.053503
%U https://bib-pubdb1.desy.de/record/598139