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| Journal Article/Contribution to a conference proceedings/Contribution to a book | PUBDB-2025-03888 |
; ;
2025
JACoW Publishing
Geneva
ISBN: 978-3-95450-262-2
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Please use a persistent id in citations: doi:10.18429/JACoW-IBIC2025-WEPCO23 doi:10.3204/PUBDB-2025-03888
Abstract: In the framework of the recent FLASH2020+ upgrade program, the longitudinal electron beam diagnostics of the FLASH accelerator had been modernized and extended by additional devices, including an electro-optical bunch length detector (EOD), as well as an additional bunch compression monitor (BCM) and a bunch arrival-time monitor BAM) in the new direct seeding beamline FLASH1. Also, the THz intensity spectrometer (CRISP) received a modernized control interface that will allow non-experts to perform bunch profile measurements.The paper presents an overview on the current status of the longitudinal electron beam diagnostics at FLASH and the ongoing (re-)commissioning.
Keyword(s): Accelerator Physics ; MC05 - MC05: Longitudinal Diagnostics and Synchronization
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