Journal Article/Contribution to a conference proceedings/Contribution to a book PUBDB-2025-03888

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Recent Upgrades Of Longitudinal Diagnostics At FLASH

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2025
JACoW Publishing Geneva
ISBN: 978-3-95450-262-2

International Beam Instrumentation Conference : Proceedings, 14th conference, IBIC2025, Liverpool, UK, 7-11.09.025
14th International Beam Instrumentation Conference, (IBIC2025), LiverpoolLiverpool, UK, 7 Sep 2025 - 11 Sep 20252025-09-072025-09-11
2673-5350 670 - 672 () [10.18429/JACoW-IBIC2025-WEPCO23]  GO

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Abstract: In the framework of the recent FLASH2020+ upgrade program, the longitudinal electron beam diagnostics of the FLASH accelerator had been modernized and extended by additional devices, including an electro-optical bunch length detector (EOD), as well as an additional bunch compression monitor (BCM) and a bunch arrival-time monitor BAM) in the new direct seeding beamline FLASH1. Also, the THz intensity spectrometer (CRISP) received a modernized control interface that will allow non-experts to perform bunch profile measurements.The paper presents an overview on the current status of the longitudinal electron beam diagnostics at FLASH and the ongoing (re-)commissioning.

Keyword(s): Accelerator Physics ; MC05 - MC05: Longitudinal Diagnostics and Synchronization


Contributing Institute(s):
  1. Strahlkontrollen (MSK)
Research Program(s):
  1. 621 - Accelerator Research and Development (POF4-621) (POF4-621)
  2. 6G2 - FLASH (DESY) (POF4-6G2) (POF4-6G2)
Experiment(s):
  1. FLASH 2020+ Project

Appears in the scientific report 2025
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Creative Commons Attribution CC BY 4.0 ; OpenAccess
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 Record created 2025-09-02, last modified 2026-02-17


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