TY  - CONF
AU  - Czwalinna, Marie Kristin
AU  - Roever, Jan
AU  - Kral, Jiri
TI  - Recent Upgrades Of Longitudinal Diagnostics At FLASH
JO  - 2673-5350
CY  - Geneva
PB  - JACoW Publishing
M1  - PUBDB-2025-03888
SN  - 978-3-95450-262-2
SP  - 670 - 672
PY  - 2025
AB  - In the framework of the recent FLASH2020+ upgrade program, the longitudinal electron beam diagnostics of the FLASH accelerator had been modernized and extended by additional devices, including an electro-optical bunch length detector (EOD), as well as an additional bunch compression monitor (BCM) and a bunch arrival-time monitor BAM) in the new direct seeding beamline FLASH1. Also, the THz intensity spectrometer (CRISP) received a modernized control interface that will allow non-experts to perform bunch profile measurements.The paper presents an overview on the current status of the longitudinal electron beam diagnostics at FLASH and the ongoing (re-)commissioning.
T2  - 14th International Beam Instrumentation Conference
CY  - 7 Sep 2025 - 11 Sep 2025, Liverpool (UK)
Y2  - 7 Sep 2025 - 11 Sep 2025
M2  - Liverpool, UK
KW  - Accelerator Physics (Other)
KW  - MC05 - MC05: Longitudinal Diagnostics and Synchronization (Other)
LB  - PUB:(DE-HGF)16 ; PUB:(DE-HGF)8 ; PUB:(DE-HGF)7
DO  - DOI:10.18429/JACoW-IBIC2025-WEPCO23
UR  - https://bib-pubdb1.desy.de/record/637663
ER  -