%0 Conference Paper
%A Czwalinna, Marie Kristin
%A Roever, Jan
%A Kral, Jiri
%T Recent Upgrades Of Longitudinal Diagnostics At FLASH
%J 2673-5350
%C Geneva
%I JACoW Publishing
%M PUBDB-2025-03888
%@ 978-3-95450-262-2
%P 670 - 672
%D 2025
%< International Beam Instrumentation Conference : Proceedings, 14th conference, IBIC2025, Liverpool, UK, 7-11.09.025
%X In the framework of the recent FLASH2020+ upgrade program, the longitudinal electron beam diagnostics of the FLASH accelerator had been modernized and extended by additional devices, including an electro-optical bunch length detector (EOD), as well as an additional bunch compression monitor (BCM) and a bunch arrival-time monitor BAM) in the new direct seeding beamline FLASH1. Also, the THz intensity spectrometer (CRISP) received a modernized control interface that will allow non-experts to perform bunch profile measurements.The paper presents an overview on the current status of the longitudinal electron beam diagnostics at FLASH and the ongoing (re-)commissioning.
%B 14th International Beam Instrumentation Conference
%C 7 Sep 2025 - 11 Sep 2025, Liverpool (UK)
Y2 7 Sep 2025 - 11 Sep 2025
M2 Liverpool, UK
%K Accelerator Physics (Other)
%K MC05 - MC05: Longitudinal Diagnostics and Synchronization (Other)
%F PUB:(DE-HGF)16 ; PUB:(DE-HGF)8 ; PUB:(DE-HGF)7
%9 Journal ArticleContribution to a conference proceedingsContribution to a book
%R 10.18429/JACoW-IBIC2025-WEPCO23
%U https://bib-pubdb1.desy.de/record/637663