Journal Article PUBDB-2022-00498

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The boson peak and the first sharp diffraction peak in (As$_2$S$_3$)$_x$(GeS$_2$)$_{1–x}$ glasses

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2021
Inst. of Semiconductor Physics Kyiv

Semiconductor physics, quantum electronics & optoelectronics 24(3), 312 - 318 () [10.15407/spqeo24.03.312]
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Abstract: The parameters of the boson peak (BP) and the first sharp diffraction peak (FSDP) in (As$_2$S$_3$)$_x$(GeS$_2$)$_{1–x}$ glasses measured using high-resolution Raman spectroscopy and high-energy synchrotron X-ray diffraction measurements are examined as a function of x. It has been found that there is no correlation between the positions of BP and FSDP. The BP position shows a nonlinear composition behavior with a maximum at about x = 0.4, whereas the FSDP position changes virtually linearly with x. The intensities of both BP and FSDP show nonlinear composition dependences with the slope changes at x = 0.4, although there is no direct proportionality. Analysis of the partial structure factors for the glasses with x = 0.2, 0.4 and 0.6 obtained in another study has shown that the cation-cation atomic pairs of Ge–Ge, Ge–As and As–As make the largest contribution to FSDP, where the Ge–Ge and Ge–As pairs are dominant.

Classification:

Contributing Institute(s):
  1. DOOR-User (DOOR ; HAS-User)
Research Program(s):
  1. 899 - ohne Topic (POF4-899) (POF4-899)
Experiment(s):
  1. DORIS Beamline BW5 (DORIS III)
  2. DORIS Beamline X1 (DORIS III)

Appears in the scientific report 2021
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Creative Commons Attribution-NoDerivs CC BY-ND 4.0 ; DOAJ ; OpenAccess ; Clarivate Analytics Master Journal List ; DOAJ Seal ; Ebsco Academic Search ; Emerging Sources Citation Index ; SCOPUS ; Web of Science Core Collection
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 Record created 2022-01-20, last modified 2025-07-24


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