Journal Article

PUBDB-2020-02998

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity

Krieft, J. (Corresponding author)Extern* ; Graulich, D. ; Moskaltsova, A.Extern* ; Bouchenoire, L. ; Francoual, S.DESY* ; Kuschel, T.Extern*

2020
IOP Publ. Bristol

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Please use a persistent id in citations: doi:10.1088/1361-6463/ab8fdc  doi:10.3204/PUBDB-2020-02998

Abstract: X-ray resonant magnetic reflectivity (XRMR) is a powerful method to determine the optical, structural and magnetic depth profiles of a variety of thin film systems. Here, we investigate samples of different complexity all measured at the Pt $\mathrm{L}_3$ absorption edge to determine the optimal procedure for the analysis of the experimental XRMR curves, especially for nontrivial bi- and multilayer samples that include differently bonded Pt from layer to layer. The software tool ReMagX is used to fit these data and model the magnetooptic depth profiles based on a highly adaptable layer stack which is modified to be a more precise and physically consistent representation of the real multilayer system. Various fitting algorithms, iterative optimization approaches and a detailed analysis of the asymmetry ratio features as well as χ 2 (goodness of fit) landscapes are utilized to improve the agreement between measurements and simulations. We present a step-by-step analysis procedure tailored to the Pt thin film systems to take advantage of the excellent magnetic sensitivity and depth resolution of XRMR.

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Contributing Institute(s):

1. DOOR-User (DOOR ; HAS-User)
2. Experimentebetreuung PETRA III (FS-PET-S)

Research Program(s):

1. 6212 - Quantum Condensed Matter: Magnetism, Superconductivity (POF3-621) (POF3-621)
2. 6G3 - PETRA III (POF3-622) (POF3-622)
3. FS-Proposal: II-20190009 (II-20190009) (II-20190009)
4. FS-Proposal: II-20170016 (II-20170016) (II-20170016)

Experiment(s):

1. PETRA Beamline P09 (PETRA III)

Appears in the scientific report 2020

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Database coverage:
; ; ; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; Essential Science Indicators ; IF < 5 ; JCR ; National-Konsortium ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Web of Science Core Collection

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