TY  - JOUR
AU  - Krieft, Jan
AU  - Graulich, Dominik
AU  - Moskaltsova, Anastasiia
AU  - Bouchenoire, Laurence
AU  - Francoual, Sonia
AU  - Kuschel, Timo
TI  - Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity
JO  - Journal of physics / D Applied physics
VL  - 53
IS  - 37
SN  - 1361-6463
CY  - Bristol
PB  - IOP Publ.
M1  - PUBDB-2020-02998
SP  - 1-16
PY  - 2020
AB  - X-ray resonant magnetic reflectivity (XRMR) is a powerful method to determine the optical, structural and magnetic depth profiles of a variety of thin film systems. Here, we investigate samples of different complexity all measured at the Pt L<sub>3</sub> absorption edge to determine the optimal procedure for the analysis of the experimental XRMR curves, especially for nontrivial bi- and multilayer samples that include differently bonded Pt from layer to layer. The software tool ReMagX is used to fit these data and model the magnetooptic depth profiles based on a highly adaptable layer stack which is modified to be a more precise and physically consistent representation of the real multilayer system. Various fitting algorithms, iterative optimization approaches and a detailed analysis of the asymmetry ratio features as well as χ 2 (goodness of fit) landscapes are utilized to improve the agreement between measurements and simulations. We present a step-by-step analysis procedure tailored to the Pt thin film systems to take advantage of the excellent magnetic sensitivity and depth resolution of XRMR.
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000551773100001
DO  - DOI:10.1088/1361-6463/ab8fdc
UR  - https://bib-pubdb1.desy.de/record/442330
ER  -