%0 Journal Article
%A Krieft, Jan
%A Graulich, Dominik
%A Moskaltsova, Anastasiia
%A Bouchenoire, Laurence
%A Francoual, Sonia
%A Kuschel, Timo
%T Advanced data analysis procedure for hard x-ray resonant magnetic reflectivity discussed for Pt thin film samples of various complexity
%J Journal of physics / D Applied physics
%V 53
%N 37
%@ 1361-6463
%C Bristol
%I IOP Publ.
%M PUBDB-2020-02998
%P 1-16
%D 2020
%X X-ray resonant magnetic reflectivity (XRMR) is a powerful method to determine the optical, structural and magnetic depth profiles of a variety of thin film systems. Here, we investigate samples of different complexity all measured at the Pt L<sub>3</sub> absorption edge to determine the optimal procedure for the analysis of the experimental XRMR curves, especially for nontrivial bi- and multilayer samples that include differently bonded Pt from layer to layer. The software tool ReMagX is used to fit these data and model the magnetooptic depth profiles based on a highly adaptable layer stack which is modified to be a more precise and physically consistent representation of the real multilayer system. Various fitting algorithms, iterative optimization approaches and a detailed analysis of the asymmetry ratio features as well as χ 2 (goodness of fit) landscapes are utilized to improve the agreement between measurements and simulations. We present a step-by-step analysis procedure tailored to the Pt thin film systems to take advantage of the excellent magnetic sensitivity and depth resolution of XRMR.
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000551773100001
%R 10.1088/1361-6463/ab8fdc
%U https://bib-pubdb1.desy.de/record/442330