Journal Article

PUBDB-2017-02115

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png A new setup for high resolution fast X-ray reflectivity data acquisition

Lippmann, M. (Corresponding author)DESY* ; Buffet, A.Extern* ; Pflaum, K. ; Ehnes, A.DESY* ; Ciobanu, A. S.DESY* ; Seeck, O.DESY*

2016
American Institute of Physics [S.l.]

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Please use a persistent id in citations: doi:10.1063/1.4967239  doi:10.3204/PUBDB-2017-02115

Abstract: A new method for fast x-ray reflectivity data acquisition is presented. The method is based on a fast rotating, slightly tilted sample reflecting to a stationary mounted position sensitive detector and it allows for measurements of reflectivity curves in a quarter of a second. The resolution in q-space mainly depends on the beam properties and the pixel size of the detector. Maximum q$_{z}$-value of 1 Å$^{−1}$ can be achieved. The time-temperature depending structure changes of poly($N$-isopropylacrylamide) thin films were investigated in situ by applying the fast-reflectivity setup. The results are presented in this paper as illustration of the method and proof of principle.

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Contributing Institute(s):

1. Experimentebetreuung PETRA III (FS-PE)
2. FS-Arbeitsgruppe (FS-TI)
3. DOOR-User (DOOR)

Research Program(s):

1. 6215 - Soft Matter, Health and Life Sciences (POF3-621) (POF3-621)
2. 6G3 - PETRA III (POF3-622) (POF3-622)

Experiment(s):

1. PETRA Beamline P08 (PETRA III)

Appears in the scientific report 2016

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Database coverage:
; ; ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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