TY  - JOUR
AU  - Lippmann, Milena
AU  - Buffet, Adeline
AU  - Pflaum, Kathrin
AU  - Ehnes, Anita
AU  - Ciobanu, Anca Simona
AU  - Seeck, Oliver
TI  - A new setup for high resolution fast X-ray reflectivity data acquisition
JO  - Review of scientific instruments
VL  - 87
IS  - 11
SN  - 1089-7623
CY  - [S.l.]
PB  - American Institute of Physics
M1  - PUBDB-2017-02115
SP  - 113904 
PY  - 2016
AB  - A new method for fast x-ray reflectivity data acquisition is presented. The method is based on a fast rotating, slightly tilted sample reflecting to a stationary mounted position sensitive detector and it allows for measurements of reflectivity curves in a quarter of a second. The resolution in q-space mainly depends on the beam properties and the pixel size of the detector. Maximum q<sub>z</sub>-value of 1 Å<sup>−1</sup> can be achieved. The time-temperature depending structure changes of poly(N-isopropylacrylamide) thin films were investigated in situ by applying the fast-reflectivity setup. The results are presented in this paper as illustration of the method and proof of principle. 
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000390242300349
C6  - pmid:27910596
DO  - DOI:10.1063/1.4967239
UR  - https://bib-pubdb1.desy.de/record/320838
ER  -