%0 Journal Article
%A Lippmann, Milena
%A Buffet, Adeline
%A Pflaum, Kathrin
%A Ehnes, Anita
%A Ciobanu, Anca Simona
%A Seeck, Oliver
%T A new setup for high resolution fast X-ray reflectivity data acquisition
%J Review of scientific instruments
%V 87
%N 11
%@ 1089-7623
%C [S.l.]
%I American Institute of Physics
%M PUBDB-2017-02115
%P 113904 
%D 2016
%X A new method for fast x-ray reflectivity data acquisition is presented. The method is based on a fast rotating, slightly tilted sample reflecting to a stationary mounted position sensitive detector and it allows for measurements of reflectivity curves in a quarter of a second. The resolution in q-space mainly depends on the beam properties and the pixel size of the detector. Maximum q<sub>z</sub>-value of 1 Å<sup>−1</sup> can be achieved. The time-temperature depending structure changes of poly(N-isopropylacrylamide) thin films were investigated in situ by applying the fast-reflectivity setup. The results are presented in this paper as illustration of the method and proof of principle. 
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000390242300349
%$ pmid:27910596
%R 10.1063/1.4967239
%U https://bib-pubdb1.desy.de/record/320838