Journal Article

PUBDB-2015-01185

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png High-Resolution Synchrotron Diffraction Study of Porous Buffer InP(001) Layers

Lomov, A. A. (Corresponding Author) ; Punegov, V. I. ; Nohavica, D. ; Chuev, M. A. ; Vasiliev, A. L. ; Novikov, D.DESY*

2014
Munksgaard Copenhagen

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Please use a persistent id in citations: doi:10.1107/S1600576714016392

Abstract: X-ray reciprocal space mapping was used for quantitative investigation of porous layers in indium phosphide. A new theoretical model in the frame of the statistical dynamical theory for cylindrical pores was developed and applied for numerical data evaluation. The analysis of reciprocal space maps provided comprehensive information on a wide range of the porous layer parameters, for example, layer thickness and porosity, orientation, and correlation length of segmented pore structures. The results are in a good agreement with scanning electron microscopy data.

Note: (c) International Union of Crystallography, OA

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Contributing Institute(s):

1. FS-Experimentebetreuung DORIS (FS-DO)
2. PETRA III Extension (FS-PEX)

Research Program(s):

1. DORIS Beamline E2 (POF2-54G13) (POF2-54G13)

Experiment(s):

1. DORIS Beamline E2 (DORIS III)

Appears in the scientific report 2014

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Database coverage:
; ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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