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E2
DORIS Beamline E2 Also known as:DORIS III
Categories | Beamline |
Identifier | EXP:(DE-H253)D-E2-20150101 |
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Journal Article
Characterization of $\mathrm{A^{III}B^V}$ superlattices by means of synchrotron diffraction topography and high-resolution X-ray diffraction
Journal of applied crystallography 50(4), 1192 - 1199 (2017) [10.1107/S1600576717008846]
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Analysis of modulated $Ho_{2}PdSi_{3}$ crystal structure at Pd K and Ho L absorption edges using resonant elastic X-scattering
Journal of physics / Condensed matter 28(6), 066002 (2016) [10.1088/0953-8984/28/6/066002]
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High Resolution X-Ray Diffractometric, Topographic and Reflectometric Studies of Epitaxial Layers on Porous Silicon Destined for Exfoliation
X-ray spectrometry 44(5), 363-370 (2015) [10.1002/xrs.2641]
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Characterization of crystal lattice defects in calciu molybdate single crystals $\mathrm{(CaMoO_{4})}$ by means of X-ray diffraction topography
X-ray spectrometry 44(5), 351 - 355 (2015) [10.1002/xrs.2639]
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Crystallization dynamics and interface stability of strontium titanate thin films on silicon
Seminar, GermanyGermany,
Journal of applied crystallography 48(2), 393 - 400 (2015) [10.1107/S160057671500240X]
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Evaluation of structure models of Ho-2 PdSi-3 using DAFS, inter alia at a satellite reflection
Seminar, GermanyGermany,
Journal of physics / Conference Series 519, 012011 - 012016 (2014) [10.1088/1742-6596/519/1/012011]
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Journal Article
High-Resolution Synchrotron Diffraction Study of Porous Buffer InP(001) Layers
Journal of applied crystallography 47(5), 1614 - 1625 (2014) [10.1107/S1600576714016392]
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Model independent x-ray standing wave analysis of periodic multilayer structures
Journal of applied physics 115(13), 134303 (2014) [10.1063/1.4869540]
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Probing a crystal's short-range structure and local orbitals by Resonant X-ray Diffraction methods
Crystal research and technology 49(1), 43 - 54 (2014) [10.1002/crat.201300430]
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Ion irradiation induced evolution of nanostructure in a graded multi-trilayer system
Applied surface science 258, 3967 (2012) [10.1016/j.apsusc.2011.12.074]
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