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@ARTICLE{Yakunin:168766,
      author       = {Yakunin, Sergey and Makhotkin, Igor and van de Kruijs, R.
                      W. E. and Chuev, Mikhail and Pashaev, E. M. and Zoethout, E.
                      and Louis, E. and Seregin, S. Yu. and Subbotin, I. A. and
                      Novikov, Dmitri and Bijkerk, F. and Kovalchuk, M. V.},
      title        = {{M}odel independent x-ray standing wave analysis of
                      periodic multilayer structures},
      journal      = {Journal of applied physics},
      volume       = {115},
      number       = {13},
      issn         = {1089-7550},
      address      = {Melville, NY},
      publisher    = {American Institute of Physics},
      reportid     = {DESY-2014-02652},
      pages        = {134303},
      year         = {2014},
      abstract     = {We present a model independent approach for the analysis of
                      X-ray fluorescence yield modulated by an X-ray standing wave
                      (XSW), that allow a fast reconstruction of the atomic
                      distribution function inside a sample without fitting
                      procedure. The approach is based on the direct regularized
                      solution of the system of linear equations that
                      characterizes the fluorescence yield. The suggested
                      technique was optimized for, but not limited to, the
                      analysis of periodic layered structures where the XSW is
                      formed under Bragg conditions. The developed approach was
                      applied to the reconstruction of the atomic distribution
                      function for LaN/BN multilayers with 50 periods of 43 Å
                      thick layers. The object is especially difficult to analyze
                      with traditional methods, as the estimated thickness of the
                      interface region between the constituent materials is
                      comparable to the individual layer thicknesses. However,
                      using the suggested technique, it was possible to
                      reconstruct width of the La atomic distribution showing that
                      the La atoms stay localized within the LaN layers and
                      interfaces and do not diffuse into the BN layer. The
                      analysis of the reconstructed profiles showed that the
                      positions of the center of the atomic distribution function
                      can be estimated with an accuracy of 1 Å.},
      cin          = {DOOR / FS-DO},
      ddc          = {530},
      cid          = {I:(DE-H253)HAS-User-20120731 / I:(DE-H253)FS-DO-20120731},
      pnm          = {DORIS Beamline E2 (POF2-54G13)},
      pid          = {G:(DE-H253)POF2-E2-20130405},
      experiment   = {EXP:(DE-H253)D-E2-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000334578200047},
      doi          = {10.1063/1.4869540},
      url          = {https://bib-pubdb1.desy.de/record/168766},
}