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@ARTICLE{Wierzchowski:399304,
      author       = {Wierzchowski, Wojciech and Wieteska, Krzysztof and Gaca,
                      Jarosław and Wójcik, Marek and Możdżonek, Małgorzata
                      and Strupiński, Włodzimierz and Wesołowski, Marek and
                      Paulmann, Carsten},
      title        = {{C}haracterization of $\mathrm{{A}^{{III}}{B}^{V}}$
                      superlattices by means of synchrotron diffraction topography
                      and high-resolution {X}-ray diffraction},
      journal      = {Journal of applied crystallography},
      volume       = {50},
      number       = {4},
      issn         = {1600-5767},
      address      = {Copenhagen},
      publisher    = {Munksgaard},
      reportid     = {PUBDB-2018-00603},
      pages        = {1192 - 1199},
      year         = {2017},
      note         = {(c) International Union of Crystallography; Post referee
                      fulltext in progress 2},
      abstract     = {New possibilities are presented for the characterization of
                      A$^{III}$B$^V$ mixed superlattice compounds by the
                      complementary use of synchrotron diffraction topography and
                      rocking curves. In particular, using a synchrotron white
                      beam and the section diffraction pattern of a 5 µm slit
                      taken at a 10 cm film-to-crystal distance, it was possible
                      to reproduce a set of stripes corresponding to interference
                      fringes. These are analogous to the interference maxima
                      revealed in high-resolution rocking curves, but are created
                      by the changes in orientation of the planes inclined to the
                      surface which are induced by unrelaxed strain. The section
                      diffraction topographic method enabled examination of the
                      sample homogeneity along the narrow intersecting beam. This
                      was important in the case of the present sample containing a
                      twin lamella in the InP substrate wafer. Both the section
                      and projection Bragg case topographic methods enabled the
                      crystallographic identification of the twin lamella. Another
                      characteristic feature indicated in the section topography
                      was the bending of the stripes corresponding to the
                      superlattice peaks close to the boundaries of the twin
                      lamella. The most probable interpretation of this phenomenon
                      is an increase in the thickness of the deposited layers
                      close to the lamella, together with possible changes in the
                      chemical composition, leading to a decrease in the mean
                      lattice parameter in the superlattice.},
      cin          = {DOOR / FS-PEX},
      ddc          = {540},
      cid          = {I:(DE-H253)HAS-User-20120731 / I:(DE-H253)FS-PEX-20130206},
      pnm          = {6213 - Materials and Processes for Energy and Transport
                      Technologies (POF3-621)},
      pid          = {G:(DE-HGF)POF3-6213},
      experiment   = {EXP:(DE-H253)D-E2-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000407040700023},
      doi          = {10.1107/S1600576717008846},
      url          = {https://bib-pubdb1.desy.de/record/399304},
}