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@ARTICLE{Zschornak:167546,
author = {Zschornak, Matthias and Richter, Carsten and Nentwich,
Melanie and Stöcker, Hartmut and Gemming, Sibylle and
Meyer, Dirk C.},
title = {{P}robing a crystal's short-range structure and local
orbitals by {R}esonant {X}-ray {D}iffraction methods},
journal = {Crystal research and technology},
volume = {49},
number = {1},
issn = {0232-1300},
address = {Weinheim},
publisher = {Wiley-VCH},
reportid = {DESY-2014-01881},
pages = {43 - 54},
year = {2014},
abstract = {Diffraction Anomalous Fine Structure (DAFS) combines the
long-range, crystallographic sensitivity of X-ray
diffraction with the short-range sensitivity of X-ray
Absorption Spectroscopy (XAS). In comparison to other
spectroscopic methods, DAFS can additionally distinguish
phases of different translational symmetry by choice of
momentum transfer, or isolate spectra from chemically
identical atoms on various Wyckoff sites of a crystal's
structure using crystallographic weights. The Anisotropy of
Anomalous Scattering (AAS) extends the concept of
isotropically scattering atoms to a more general case, where
the atom's scattering characteristics depend on the
polarization as well as the wavevector of the incident and
scattered X-rays. These can be written as tensors that
reflect the local site symmetries of the resonant atom.
Forbidden Reflection Near-Edge Diffraction (FRED) is an
elegant way to measure AAS by using reflections that are
extinguished in the special case of isotropically scattering
atoms. They can only be observed due to the non-isotropic
contributions at photon energies in the vicinity of an
absorption edge where electronic transitions occur.
Combining the site selectivity of DAFS with the information
accessible through AAS allows probing the short-range order
and local orbitals of selected atoms in a crystal structure
of a chosen phase. The present condensed review gives a
brief overview on the pioneer work, the theory and
sensitivities as well as selected recent applications of
these powerful and promising Resonant X-ray Diffraction
(RXD) methods. Additionally, some recent work of the authors
is included exemplarily for the model structure rutile TiO2
presenting the progress in measurement and interpretation.},
cin = {DOOR / FS-PS / TUFreib},
ddc = {540},
cid = {I:(DE-H253)HAS-User-20120731 / I:(DE-H253)FS-PS-20131107 /
I:(DE-H253)TUFreib-20120814},
pnm = {DORIS Beamline E2 (POF2-54G13) / DORIS Beamline W1
(POF2-54G13) / FS-Proposal: I-20100400 (I-20100400)},
pid = {G:(DE-H253)POF2-E2-20130405 / G:(DE-H253)POF2-W1-20130405 /
G:(DE-H253)I-20100400},
experiment = {EXP:(DE-H253)D-E2-20150101 / EXP:(DE-H253)D-W1-20150101},
typ = {PUB:(DE-HGF)16},
UT = {WOS:000337297500008},
doi = {10.1002/crat.201300430},
url = {https://bib-pubdb1.desy.de/record/167546},
}