Journal Article

PUBDB-2025-04308

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Operation of Photo Electron Spectrometers for Non-Invasive Photon Diagnostics at the European X-Ray Free Electron Laser

Laksman, J. (Corresponding author)XFEL.EU* ; Dietrich, F.XFEL.EU* ; Maltezopoulos, T.XFEL.EU* ; Liu, J.XFEL.EU* ; Ferreira de Lima, D. E.XFEL.EU* ; Gerasimova, N.XFEL.EU* ; Karpics, I.XFEL.EU* ; Kujala, N.XFEL.EU* ; Schmidt, P.XFEL.EU* ; Karabekyan, S.XFEL.EU* ; Serkez, S.XFEL.EU* ; Gruenert, J.XFEL.EU*

2024
MDPI Basel

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Please use a persistent id in citations: doi:10.3390/app142210152  doi:10.3204/PUBDB-2025-04308

Abstract: Angle-resolved photoelectron spectrometers with microchannel plate detectors and fast digitizer electronics are versatile and powerful devices for providing non-invasive single-shot photon diagnostics at a MHz repetition rate X-ray free-electron lasers. In this contribution, we demonstrate and characterize the performance of our two operational photoelectron spectrometers for the application of hard X-rays and soft X-rays as well as new automation tools and online data analysis that enable continuous support for machine operators and instrument scientists. Customized software has been developed for the real-time monitoring of photon beam polarization and spectral distribution both in single-color and two-color operation. Hard X-ray operation imposes specific design challenges due to poor photoionization cross-sections and very high photoelectron velocities. Furthermore, recent advancements in machine learning enable resolution enhancement by training the photoelectron spectrometer together with an invasive high-resolution spectrometer, which generates a response function model.

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Contributing Institute(s):

1. X-Ray Photon Diagnostics (XFEL_DO_ID_XPD)

Research Program(s):

1. 6G13 - Accelerator of European XFEL (POF4-6G13) (POF4-6G13)

Experiment(s):

1. Experiments at XFEL

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