000639105 001__ 639105
000639105 005__ 20251210211321.0
000639105 0247_ $$2doi$$a10.3390/app142210152
000639105 0247_ $$2datacite_doi$$a10.3204/PUBDB-2025-04308
000639105 037__ $$aPUBDB-2025-04308
000639105 041__ $$aEnglish
000639105 082__ $$a600
000639105 1001_ $$0P:(DE-H253)PIP1032577$$aLaksman, Joakim$$b0$$eCorresponding author
000639105 245__ $$aOperation of Photo Electron Spectrometers for Non-Invasive Photon Diagnostics at the European X-Ray Free Electron Laser
000639105 260__ $$aBasel$$bMDPI$$c2024
000639105 3367_ $$2DRIVER$$aarticle
000639105 3367_ $$2DataCite$$aOutput Types/Journal article
000639105 3367_ $$0PUB:(DE-HGF)16$$2PUB:(DE-HGF)$$aJournal Article$$bjournal$$mjournal$$s1765361787_1395632
000639105 3367_ $$2BibTeX$$aARTICLE
000639105 3367_ $$2ORCID$$aJOURNAL_ARTICLE
000639105 3367_ $$00$$2EndNote$$aJournal Article
000639105 520__ $$aAngle-resolved photoelectron spectrometers with microchannel plate detectors and fast digitizer electronics are versatile and powerful devices for providing non-invasive single-shot photon diagnostics at a MHz repetition rate X-ray free-electron lasers. In this contribution, we demonstrate and characterize the performance of our two operational photoelectron spectrometers for the application of hard X-rays and soft X-rays as well as new automation tools and online data analysis that enable continuous support for machine operators and instrument scientists. Customized software has been developed for the real-time monitoring of photon beam polarization and spectral distribution both in single-color and two-color operation. Hard X-ray operation imposes specific design challenges due to poor photoionization cross-sections and very high photoelectron velocities. Furthermore, recent advancements in machine learning enable resolution enhancement by training the photoelectron spectrometer together with an invasive high-resolution spectrometer, which generates a response function model.
000639105 536__ $$0G:(DE-HGF)POF4-6G13$$a6G13 - Accelerator of European XFEL (POF4-6G13)$$cPOF4-6G13$$fPOF IV$$x0
000639105 588__ $$aDataset connected to CrossRef, Journals: bib-pubdb1.desy.de
000639105 693__ $$0EXP:(DE-H253)XFEL-Exp-20150101$$1EXP:(DE-H253)XFEL-20150101$$5EXP:(DE-H253)XFEL-Exp-20150101$$aXFEL$$eExperiments at XFEL$$x0
000639105 7001_ $$0P:(DE-H253)PIP1020566$$aDietrich, Florian$$b1
000639105 7001_ $$0P:(DE-H253)PIP1006756$$aMaltezopoulos, Theophilos$$b2
000639105 7001_ $$0P:(DE-H253)PIP1019426$$aLiu, Jia$$b3
000639105 7001_ $$0P:(DE-H253)PIP1028636$$aFerreira de Lima, Danilo Enoque$$b4
000639105 7001_ $$0P:(DE-H253)PIP1005688$$aGerasimova, Natalia$$b5
000639105 7001_ $$0P:(DE-H253)PIP1019624$$aKarpics, Ivars$$b6
000639105 7001_ $$0P:(DE-H253)PIP1023733$$aKujala, Naresh$$b7
000639105 7001_ $$0P:(DE-H253)PIP1014429$$aSchmidt, Philipp$$b8
000639105 7001_ $$0P:(DE-H253)PIP1010725$$aKarabekyan, Suren$$b9
000639105 7001_ $$0P:(DE-H253)PIP1012664$$aSerkez, Svitozar$$b10
000639105 7001_ $$0P:(DE-H253)PIP1007149$$aGruenert, Jan$$b11
000639105 773__ $$0PERI:(DE-600)2704225-X$$a10.3390/app142210152$$gVol. 14, no. 22, p. 10152 -$$n22$$p10152 -$$tApplied Sciences$$v14$$x2076-3417$$y2024
000639105 8564_ $$uhttps://www.mdpi.com/2076-3417/14/22/10152
000639105 8564_ $$uhttps://bib-pubdb1.desy.de/record/639105/files/Operation%20of%20Photo%20Electron%20Spectrometers%20for%20Non-Invasive%20Photon%20Diagnostics%20at%20the%20European%20X-Ray%20Free%20Electron%20Laser.pdf$$yOpenAccess
000639105 8564_ $$uhttps://bib-pubdb1.desy.de/record/639105/files/Operation%20of%20Photo%20Electron%20Spectrometers%20for%20Non-Invasive%20Photon%20Diagnostics%20at%20the%20European%20X-Ray%20Free%20Electron%20Laser.pdf?subformat=pdfa$$xpdfa$$yOpenAccess
000639105 909CO $$ooai:bib-pubdb1.desy.de:639105$$popenaire$$popen_access$$pVDB$$pdriver$$pdnbdelivery
000639105 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1032577$$aEuropean XFEL$$b0$$kXFEL.EU
000639105 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1020566$$aEuropean XFEL$$b1$$kXFEL.EU
000639105 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1006756$$aEuropean XFEL$$b2$$kXFEL.EU
000639105 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1019426$$aEuropean XFEL$$b3$$kXFEL.EU
000639105 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1028636$$aEuropean XFEL$$b4$$kXFEL.EU
000639105 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1005688$$aEuropean XFEL$$b5$$kXFEL.EU
000639105 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1019624$$aEuropean XFEL$$b6$$kXFEL.EU
000639105 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1023733$$aEuropean XFEL$$b7$$kXFEL.EU
000639105 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1014429$$aEuropean XFEL$$b8$$kXFEL.EU
000639105 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1010725$$aEuropean XFEL$$b9$$kXFEL.EU
000639105 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1012664$$aEuropean XFEL$$b10$$kXFEL.EU
000639105 9101_ $$0I:(DE-588)1043621512$$6P:(DE-H253)PIP1007149$$aEuropean XFEL$$b11$$kXFEL.EU
000639105 9131_ $$0G:(DE-HGF)POF4-6G13$$1G:(DE-HGF)POF4-6G0$$2G:(DE-HGF)POF4-600$$3G:(DE-HGF)POF4$$4G:(DE-HGF)POF$$aDE-HGF$$bForschungsbereich Materie$$lGroßgeräte: Materie$$vAccelerator of European XFEL$$x0
000639105 915__ $$0StatID:(DE-HGF)0200$$2StatID$$aDBCoverage$$bSCOPUS$$d2024-12-27
000639105 915__ $$0StatID:(DE-HGF)0160$$2StatID$$aDBCoverage$$bEssential Science Indicators$$d2024-12-27
000639105 915__ $$0StatID:(DE-HGF)1160$$2StatID$$aDBCoverage$$bCurrent Contents - Engineering, Computing and Technology$$d2024-12-27
000639105 915__ $$0LIC:(DE-HGF)CCBY4$$2HGFVOC$$aCreative Commons Attribution CC BY 4.0
000639105 915__ $$0StatID:(DE-HGF)0100$$2StatID$$aJCR$$bAPPL SCI-BASEL : 2022$$d2024-12-27
000639105 915__ $$0StatID:(DE-HGF)0501$$2StatID$$aDBCoverage$$bDOAJ Seal$$d2024-04-10T15:30:53Z
000639105 915__ $$0StatID:(DE-HGF)0500$$2StatID$$aDBCoverage$$bDOAJ$$d2024-04-10T15:30:53Z
000639105 915__ $$0StatID:(DE-HGF)0113$$2StatID$$aWoS$$bScience Citation Index Expanded$$d2024-12-27
000639105 915__ $$0StatID:(DE-HGF)0700$$2StatID$$aFees$$d2024-12-27
000639105 915__ $$0StatID:(DE-HGF)0150$$2StatID$$aDBCoverage$$bWeb of Science Core Collection$$d2024-12-27
000639105 915__ $$0StatID:(DE-HGF)9900$$2StatID$$aIF < 5$$d2024-12-27
000639105 915__ $$0StatID:(DE-HGF)0510$$2StatID$$aOpenAccess
000639105 915__ $$0StatID:(DE-HGF)0030$$2StatID$$aPeer Review$$bDOAJ : Anonymous peer review$$d2024-04-10T15:30:53Z
000639105 915__ $$0StatID:(DE-HGF)0561$$2StatID$$aArticle Processing Charges$$d2024-12-27
000639105 915__ $$0StatID:(DE-HGF)1150$$2StatID$$aDBCoverage$$bCurrent Contents - Physical, Chemical and Earth Sciences$$d2024-12-27
000639105 915__ $$0StatID:(DE-HGF)0300$$2StatID$$aDBCoverage$$bMedline$$d2024-12-27
000639105 915__ $$0StatID:(DE-HGF)0199$$2StatID$$aDBCoverage$$bClarivate Analytics Master Journal List$$d2024-12-27
000639105 9201_ $$0I:(DE-H253)XFEL_DO_ID_XPD-20210408$$kXFEL_DO_ID_XPD$$lX-Ray Photon Diagnostics$$x0
000639105 980__ $$ajournal
000639105 980__ $$aVDB
000639105 980__ $$aUNRESTRICTED
000639105 980__ $$aI:(DE-H253)XFEL_DO_ID_XPD-20210408
000639105 9801_ $$aFullTexts