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@ARTICLE{Laksman:639105,
      author       = {Laksman, Joakim and Dietrich, Florian and Maltezopoulos,
                      Theophilos and Liu, Jia and Ferreira de Lima, Danilo Enoque
                      and Gerasimova, Natalia and Karpics, Ivars and Kujala,
                      Naresh and Schmidt, Philipp and Karabekyan, Suren and
                      Serkez, Svitozar and Gruenert, Jan},
      title        = {{O}peration of {P}hoto {E}lectron {S}pectrometers for
                      {N}on-{I}nvasive {P}hoton {D}iagnostics at the {E}uropean
                      {X}-{R}ay {F}ree {E}lectron {L}aser},
      journal      = {Applied Sciences},
      volume       = {14},
      number       = {22},
      issn         = {2076-3417},
      address      = {Basel},
      publisher    = {MDPI},
      reportid     = {PUBDB-2025-04308},
      pages        = {10152 -},
      year         = {2024},
      abstract     = {Angle-resolved photoelectron spectrometers with
                      microchannel plate detectors and fast digitizer electronics
                      are versatile and powerful devices for providing
                      non-invasive single-shot photon diagnostics at a MHz
                      repetition rate X-ray free-electron lasers. In this
                      contribution, we demonstrate and characterize the
                      performance of our two operational photoelectron
                      spectrometers for the application of hard X-rays and soft
                      X-rays as well as new automation tools and online data
                      analysis that enable continuous support for machine
                      operators and instrument scientists. Customized software has
                      been developed for the real-time monitoring of photon beam
                      polarization and spectral distribution both in single-color
                      and two-color operation. Hard X-ray operation imposes
                      specific design challenges due to poor photoionization
                      cross-sections and very high photoelectron velocities.
                      Furthermore, recent advancements in machine learning enable
                      resolution enhancement by training the photoelectron
                      spectrometer together with an invasive high-resolution
                      spectrometer, which generates a response function model.},
      cin          = {$XFEL_DO_ID_XPD$},
      ddc          = {600},
      cid          = {$I:(DE-H253)XFEL_DO_ID_XPD-20210408$},
      pnm          = {6G13 - Accelerator of European XFEL (POF4-6G13)},
      pid          = {G:(DE-HGF)POF4-6G13},
      experiment   = {EXP:(DE-H253)XFEL-Exp-20150101},
      typ          = {PUB:(DE-HGF)16},
      doi          = {10.3390/app142210152},
      url          = {https://bib-pubdb1.desy.de/record/639105},
}