Journal Article PUBDB-2024-05953

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Comparing single-shot damage thresholds of boron carbide and silicon at the European XFEL

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2024
Wiley-Blackwell [Erscheinungsort nicht ermittelbar]

Journal of synchrotron radiation 31(5), 1067-1070 () [10.1107/S1600577524007318]
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Abstract: Xray free-electron lasers (XFELs) enable experiments that would have beenimpractical or impossible at conventional X-ray laser facilities. Indeed, moreXFEL facilities are being built and planned, with their aim to deliver largerpulse energies and higher peak brilliance. While seeking to increase the pulsepower, it is quintessential to consider the maximum pulse fluence that a grazingincidenceFEL mirror can withstand. To address this issue, several studies wereconducted on grazing-incidence damage by soft X-ray FEL pulses at theEuropean XFEL facility. Boron carbide (B4C) coatings on polished siliconsubstrate were investigated using 1 keV photon energy, similar to the X-raymirrors currently installed at the soft X-ray beamlines (SASE3). The purpose ofthis study is to compare the damage threshold of B4C and Si to determine theadvantages, tolerance and limits of using B4C coatings.

Classification:

Contributing Institute(s):
  1. X-Ray Optics (XFEL_DO_ID_XRO)
  2. Koordination des XFEL-Beschleunigers (MXL)
Research Program(s):
  1. 621 - Accelerator Research and Development (POF4-621) (POF4-621)
  2. 6G13 - Accelerator of European XFEL (POF4-6G13) (POF4-6G13)
Experiment(s):
  1. Experiments at XFEL

Appears in the scientific report 2024
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Private Collections > >DESY > >M > MXL
Private Collections > >XFEL.EU > XFEL_DO_ID_XRO
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 Record created 2024-09-16, last modified 2025-08-08


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