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@ARTICLE{Tavakkoly:614733,
author = {Tavakkoly, Marziyeh and Chalupsky, Jaromir and Hajkova,
Vera and Hillert, Wolfgang and Jelinek, Simon and Juha,
Libor and Makita, Mikako and Mazza, Tommaso and Meyer,
Michael and Montano, Jacobo and Sinn, Harald and Vozda,
Vojtech and Vannoni, Maurizio},
title = {{C}omparing single-shot damage thresholds of boron carbide
and silicon at the {E}uropean {XFEL}},
journal = {Journal of synchrotron radiation},
volume = {31},
number = {5},
issn = {1600-5775},
address = {[Erscheinungsort nicht ermittelbar]},
publisher = {Wiley-Blackwell},
reportid = {PUBDB-2024-05953},
pages = {1067-1070},
year = {2024},
abstract = {Xray free-electron lasers (XFELs) enable experiments that
would have beenimpractical or impossible at conventional
X-ray laser facilities. Indeed, moreXFEL facilities are
being built and planned, with their aim to deliver
largerpulse energies and higher peak brilliance. While
seeking to increase the pulsepower, it is quintessential to
consider the maximum pulse fluence that a
grazingincidenceFEL mirror can withstand. To address this
issue, several studies wereconducted on grazing-incidence
damage by soft X-ray FEL pulses at theEuropean XFEL
facility. Boron carbide (B4C) coatings on polished
siliconsubstrate were investigated using 1 keV photon
energy, similar to the X-raymirrors currently installed at
the soft X-ray beamlines (SASE3). The purpose ofthis study
is to compare the damage threshold of B4C and Si to
determine theadvantages, tolerance and limits of using B4C
coatings.},
cin = {$XFEL_DO_ID_XRO$ / MXL},
ddc = {550},
cid = {$I:(DE-H253)XFEL_DO_ID_XRO-20210408$ /
I:(DE-H253)MXL-20160301},
pnm = {621 - Accelerator Research and Development (POF4-621) /
6G13 - Accelerator of European XFEL (POF4-6G13)},
pid = {G:(DE-HGF)POF4-621 / G:(DE-HGF)POF4-6G13},
experiment = {EXP:(DE-H253)XFEL-Exp-20150101},
typ = {PUB:(DE-HGF)16},
pubmed = {pmid:39182203},
UT = {WOS:001362324700009},
doi = {10.1107/S1600577524007318},
url = {https://bib-pubdb1.desy.de/record/614733},
}