TY  - JOUR
AU  - Tavakkoly, Marziyeh
AU  - Chalupsky, Jaromir
AU  - Hajkova, Vera
AU  - Hillert, Wolfgang
AU  - Jelinek, Simon
AU  - Juha, Libor
AU  - Makita, Mikako
AU  - Mazza, Tommaso
AU  - Meyer, Michael
AU  - Montano, Jacobo
AU  - Sinn, Harald
AU  - Vozda, Vojtech
AU  - Vannoni, Maurizio
TI  - Comparing single-shot damage thresholds of boron carbide and silicon at the European XFEL
JO  - Journal of synchrotron radiation
VL  - 31
IS  - 5
SN  - 1600-5775
CY  - [Erscheinungsort nicht ermittelbar]
PB  - Wiley-Blackwell
M1  - PUBDB-2024-05953
SP  - 1067-1070
PY  - 2024
AB  - Xray free-electron lasers (XFELs) enable experiments that would have beenimpractical or impossible at conventional X-ray laser facilities. Indeed, moreXFEL facilities are being built and planned, with their aim to deliver largerpulse energies and higher peak brilliance. While seeking to increase the pulsepower, it is quintessential to consider the maximum pulse fluence that a grazingincidenceFEL mirror can withstand. To address this issue, several studies wereconducted on grazing-incidence damage by soft X-ray FEL pulses at theEuropean XFEL facility. Boron carbide (B4C) coatings on polished siliconsubstrate were investigated using 1 keV photon energy, similar to the X-raymirrors currently installed at the soft X-ray beamlines (SASE3). The purpose ofthis study is to compare the damage threshold of B4C and Si to determine theadvantages, tolerance and limits of using B4C coatings.
LB  - PUB:(DE-HGF)16
C6  - pmid:39182203
UR  - <Go to ISI:>//WOS:001362324700009
DO  - DOI:10.1107/S1600577524007318
UR  - https://bib-pubdb1.desy.de/record/614733
ER  -