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Journal Article | PUBDB-2022-06857 |
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2022
Wiley-Blackwell
[S.l.]
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Please use a persistent id in citations: doi:10.1107/S1600577522008025 doi:10.3204/PUBDB-2022-06857
Report No.: arXiv:2201.13264
Abstract: X-ray diffraction with high spatial resolution is commonly used to characterize(poly)crystalline samples with, for example, respect to local strain, residualstress, grain boundaries and texture. However, the investigation of highlyabsorbing samples or the simultaneous assessment of high-Zmaterials by X-rayfluorescence have been limited due to the utilization of low photon energies.Here, a goniometer-based setup implemented at the P06 beamline of PETRAIII that allows for micrometre spatial resolution with a photon energy of 35 keVand above is reported. A highly focused beam was achieved by using compoundrefractive lenses, and high-precision sample manipulation was enabled by agoniometer that allows up to 5D scans (three rotations and two translations).As experimental examples, the determination of local strain variations inmartensitic steel samples with micrometre spatial resolution, as well as thesimultaneous elemental distribution for high-Zmaterials in a thin-film solar cell,are demonstrated. The proposed approach allows users from the materials-science community to determine micro-structural properties even in highly absorbing samples.
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X-ray diffraction with micrometer spatial resolution for highly absorbing samples
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