%0 Electronic Article
%A Chakrabarti, P.
%A Wildeis, A.
%A Hartmann, M.
%A Brandt, R.
%A Döhrmann, R.
%A Fevola, G.
%A Ossig, C.
%A Stuckelberger, M. E.
%A Garrevoet, J.
%A Falch, K. V.
%A Galbierz, V.
%A Falkenberg, Gerald
%A Modregger, P.
%T X-ray diffraction with micrometer spatial resolution for highly absorbing samples
%N arXiv:2201.13264
%M PUBDB-2022-01322
%M arXiv:2201.13264
%D 2022
%X X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilisation of low photon energies. Here, we report on a goniometer-based setup implemented at the P06 beamline of PETRA III that allows for micrometer spatial resolution with a photon energy of 35 keV and above. A highly focused beam was achieved by using compound refractive lenses and high precision sample manipulation was enabled by a goniometer that allows for up to 5D scans (3 rotations </td><td width="150">
%X  2 translations). As experimental examples, we demonstrate the determination of local strain variations in martensitic steel samples with micrometer spatial resolution as well as the simultaneous elemental distribution for high-Z materials in a thin film solar cell. Our proposed approach allows users from the materials science community to determine micro-structural properties even in highly absorbing samples.
%K Materials Science (cond-mat.mtrl-sci) (Other)
%K Applied Physics (physics.app-ph) (Other)
%K FOS: Physical sciences (Other)
%F PUB:(DE-HGF)25
%9 Preprint
%U https://bib-pubdb1.desy.de/record/475341