TY  - EJOUR
AU  - Chakrabarti, P.
AU  - Wildeis, A.
AU  - Hartmann, M.
AU  - Brandt, R.
AU  - Döhrmann, R.
AU  - Fevola, G.
AU  - Ossig, C.
AU  - Stuckelberger, M. E.
AU  - Garrevoet, J.
AU  - Falch, K. V.
AU  - Galbierz, V.
AU  - Falkenberg, Gerald
AU  - Modregger, P.
TI  - X-ray diffraction with micrometer spatial resolution for highly absorbing samples
IS  - arXiv:2201.13264
M1  - PUBDB-2022-01322
M1  - arXiv:2201.13264
PY  - 2022
AB  - X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilisation of low photon energies. Here, we report on a goniometer-based setup implemented at the P06 beamline of PETRA III that allows for micrometer spatial resolution with a photon energy of 35 keV and above. A highly focused beam was achieved by using compound refractive lenses and high precision sample manipulation was enabled by a goniometer that allows for up to 5D scans (3 rotations </td><td width="150">
AB  -  2 translations). As experimental examples, we demonstrate the determination of local strain variations in martensitic steel samples with micrometer spatial resolution as well as the simultaneous elemental distribution for high-Z materials in a thin film solar cell. Our proposed approach allows users from the materials science community to determine micro-structural properties even in highly absorbing samples.
KW  - Materials Science (cond-mat.mtrl-sci) (Other)
KW  - Applied Physics (physics.app-ph) (Other)
KW  - FOS: Physical sciences (Other)
LB  - PUB:(DE-HGF)25
UR  - https://bib-pubdb1.desy.de/record/475341
ER  -