Journal Article PUBDB-2015-04830

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Accurate determination of segmented X-ray detector geometry

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2015
Soc. Washington, DC

Optics express 23(22), 28459 - 28470 () [10.1364/OE.23.028459]
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Abstract: Recent advances in X-ray detector technology have resulted in the introduction of segmented detectors composed of many small detector modules tiled together to cover a large detection area. Due to mechanical tolerances and the desire to be able to change the module layout to suit the needs of different experiments, the pixels on each module might not align perfectly on a regular grid. Several detectors are designed to permit detector sub-regions (or modules) to be moved relative to each other for different experiments. Accurate determination of the location of detector elements relative to the beam-sample interaction point is critical for many types of experiment, including X-ray crystallography, coherent diffractive imaging (CDI), small angle X-ray scattering (SAXS) and spectroscopy. For detectors with moveable modules, the relative positions of pixels are no longer fixed, necessitating the development of a simple procedure to calibrate detector geometry after reconfiguration. We describe a simple and robust method for determining the geometry of segmented X-ray detectors using measurements obtained by serial crystallography. By comparing the location of observed Bragg peaks to the spot locations predicted from the crystal indexing procedure, the position, rotation and distance of each module relative to the interaction region can be refined. We show that the refined detector geometry greatly improves the results of experiments.

Classification:

Contributing Institute(s):
  1. CFEL-Coherent X-Ray Imaging (FS-CFEL-1)
Research Program(s):
  1. 6215 - Soft Matter, Health and Life Sciences (POF3-621) (POF3-621)
  2. AXSIS - Frontiers in Attosecond X-ray Science: Imaging and Spectroscopy (609920) (609920)
  3. NANOMEM - Membrane Protein Nanocrystallography (317079) (317079)
  4. 05E13GU1 - Entwicklung eines "Serial Femtosecond Crystallography (SFX)"-Messtandes am Europäischen Elektronenlaser XFEL (BMBF-05E13GU1) (BMBF-05E13GU1)
Experiment(s):
  1. Experiments at CFEL
  2. Measurement at external facility

Appears in the scientific report 2015
Database coverage:
Medline ; DOAJ ; OpenAccess ; Current Contents - Physical, Chemical and Earth Sciences ; IF < 5 ; JCR ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection
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 Record created 2015-11-16, last modified 2025-07-17


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