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@ARTICLE{Yefanov:288118,
      author       = {Yefanov, Oleksandr and Mariani, Valerio and Gati, Cornelius
                      and White, Thomas A. and Chapman, Henry N. and Barty, Anton},
      title        = {{A}ccurate determination of segmented {X}-ray detector
                      geometry},
      journal      = {Optics express},
      volume       = {23},
      number       = {22},
      issn         = {1094-4087},
      address      = {Washington, DC},
      publisher    = {Soc.},
      reportid     = {PUBDB-2015-04830},
      pages        = {28459 - 28470},
      year         = {2015},
      abstract     = {Recent advances in X-ray detector technology have resulted
                      in the introduction of segmented detectors composed of many
                      small detector modules tiled together to cover a large
                      detection area. Due to mechanical tolerances and the desire
                      to be able to change the module layout to suit the needs of
                      different experiments, the pixels on each module might not
                      align perfectly on a regular grid. Several detectors are
                      designed to permit detector sub-regions (or modules) to be
                      moved relative to each other for different experiments.
                      Accurate determination of the location of detector elements
                      relative to the beam-sample interaction point is critical
                      for many types of experiment, including X-ray
                      crystallography, coherent diffractive imaging (CDI), small
                      angle X-ray scattering (SAXS) and spectroscopy. For
                      detectors with moveable modules, the relative positions of
                      pixels are no longer fixed, necessitating the development of
                      a simple procedure to calibrate detector geometry after
                      reconfiguration. We describe a simple and robust method for
                      determining the geometry of segmented X-ray detectors using
                      measurements obtained by serial crystallography. By
                      comparing the location of observed Bragg peaks to the spot
                      locations predicted from the crystal indexing procedure, the
                      position, rotation and distance of each module relative to
                      the interaction region can be refined. We show that the
                      refined detector geometry greatly improves the results of
                      experiments.},
      cin          = {FS-CFEL-1},
      ddc          = {530},
      cid          = {I:(DE-H253)FS-CFEL-1-20120731},
      pnm          = {6215 - Soft Matter, Health and Life Sciences (POF3-621) /
                      AXSIS - Frontiers in Attosecond X-ray Science: Imaging and
                      Spectroscopy (609920) / NANOMEM - Membrane Protein
                      Nanocrystallography (317079) / 05E13GU1 - Entwicklung eines
                      "Serial Femtosecond Crystallography (SFX)"-Messtandes am
                      Europäischen Elektronenlaser XFEL (BMBF-05E13GU1)},
      pid          = {G:(DE-HGF)POF3-6215 / G:(EU-Grant)609920 /
                      G:(EU-Grant)317079 / G:(DE-H253)BMBF-05E13GU1},
      experiment   = {EXP:(DE-H253)CFEL-Exp-20150101 /
                      EXP:(DE-MLZ)External-20140101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000366578900037},
      pubmed       = {pmid:26561117},
      doi          = {10.1364/OE.23.028459},
      url          = {https://bib-pubdb1.desy.de/record/288118},
}