Journal Article

DESY-2013-00138

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png In situ focus characterization by ablation technique to enable optics alignment at an XUV FEL source

Gerasimova, N. (Corresponding author)Extern*DESY*XFEL* ; Dziarzhytski, S.DESY* ; Weigelt, H.DESY* ; Chalupský, J. ; Hájková, V. ; Vyšín, L. ; Juha, L.

2013
American Institute of Physics [S.l.]

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Please use a persistent id in citations: doi:10.1063/1.4807896  doi:10.3204/DESY-2013-00138

Abstract: In situ focus characterization is demonstrated by working at an extreme ultraviolet (XUV) freeelectronlaser source using ablation technique. Design of the instrument reported here allows reachinga few micrometres resolution along with keeping the ultrahigh vacuum conditions and ensureshigh-contrast visibility of ablative imprints on optically transparent samples, e.g., PMMA. This enableson-line monitoring of the beam profile changes and thus makes possible in situ alignment ofthe XUV focusing optics. A good agreement between focal characterizations retrieved from in situinspection of ablative imprints contours and from well-established accurate ex situ analysis with Nomarskimicroscope has been observed for a typical micro-focus experiment.

Note: © AIP Publishing LLC

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Contributing Institute(s):

1. Experimentebetreuung FLASH (FS-FL)

Research Program(s):

1. FLASH Beamline PG2 (POF2-54G16) (POF2-54G16)

Experiment(s):

1. FLASH Beamline PG2 (FLASH)

Appears in the scientific report 2013

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Database coverage:
; ; Allianz-Lizenz / DFG ; Current Contents - Life Sciences ; Current Contents - Physical, Chemical and Earth Sciences ; JCR ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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