Journal Article

PHPPUBDB-26350

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Surface sensitive reflection mode EXAFS from layered sample systems: The influence of surface and interface roughness

Keil, P. ; Lützenkirchen-Hecht, D. ; DESY

2009
IUCr Chester

This record in other databases:      

Please use a persistent id in citations: doi:10.1107/S0909049509015684  doi:10.3204/PHPPUBDB-26350

Note: © International Union of Crystallography

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Contributing Institute(s):

1. Experiments with synchrotron radiation (HASYLAB(-2012))

Research Program(s):

1. DORIS Beamline BW1 (POF1-550) (POF1-550)

Experiment(s):

1. DORIS Beamline BW1 (DORIS III)

Appears in the scientific report 2009

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Database coverage:
; JCR ; No Author Disambiguation ; Thomson Reuters Master Journal List ; Web of Science Core Collection

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