%0 Journal Article
%A Keil, P.
%A Lützenkirchen-Hecht, D.
%A DESY
%T Surface sensitive reflection mode EXAFS from layered sample systems:   The influence of surface and interface roughness
%J Journal of synchrotron radiation
%V 16
%@ 0909-0495
%C Chester
%I IUCr
%M PHPPUBDB-26350
%P 443-454
%D 2009
%Z © International Union of Crystallography
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000267047100001
%$ pmid:19535856
%R 10.1107/S0909049509015684
%U https://bib-pubdb1.desy.de/record/148367