TY  - JOUR
AU  - Keil, P.
AU  - Lützenkirchen-Hecht, D.
AU  - DESY
TI  - Surface sensitive reflection mode EXAFS from layered sample systems:   The influence of surface and interface roughness
JO  - Journal of synchrotron radiation
VL  - 16
SN  - 0909-0495
CY  - Chester
PB  - IUCr
M1  - PHPPUBDB-26350
SP  - 443-454
PY  - 2009
N1  - © International Union of Crystallography
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000267047100001
C6  - pmid:19535856
DO  - DOI:10.1107/S0909049509015684
UR  - https://bib-pubdb1.desy.de/record/148367
ER  -