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@ARTICLE{Keil:148367,
      author       = {Keil, P. and Lützenkirchen-Hecht, D. and DESY},
      title        = {{S}urface sensitive reflection mode {EXAFS} from layered
                      sample systems: {T}he influence of surface and interface
                      roughness},
      journal      = {Journal of synchrotron radiation},
      volume       = {16},
      issn         = {0909-0495},
      address      = {Chester},
      publisher    = {IUCr},
      reportid     = {PHPPUBDB-26350},
      pages        = {443-454},
      year         = {2009},
      note         = {© International Union of Crystallography},
      cin          = {HASYLAB(-2012)},
      ddc          = {540},
      cid          = {$I:(DE-H253)HASYLAB_-2012_-20130307$},
      pnm          = {DORIS Beamline BW1 (POF1-550)},
      pid          = {G:(DE-H253)POF1-BW1-20130405},
      experiment   = {EXP:(DE-H253)D-BW1-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000267047100001},
      pubmed       = {pmid:19535856},
      doi          = {10.1107/S0909049509015684},
      url          = {https://bib-pubdb1.desy.de/record/148367},
}