Journal Article PHPPUBDB-12590

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Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction

 ;  ;  ;  ;  ; DESY

2009
Elsevier Science Amsterdam [u.a.]

7th International Workshop on Epitaxial Semiconductors on Patterned Substrates and Novel Index Surfaces, ESPS-NIS 2007, MarseilleMarseille, France, 21 Apr 2008 - 24 Apr 20082008-04-212008-04-24 Materials science in semiconductor processing 12, 75 () [10.1016/j.mssp.2009.07.009]
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Note: © Elsevier Ltd.; Post referee fulltext in progress 2; Embargo 12 months from publication

Contributing Institute(s):
  1. Experiments with synchrotron radiation (HASYLAB(-2012))
Research Program(s):
  1. DORIS Beamline BW2 (POF1-550) (POF1-550)
Experiment(s):
  1. DORIS Beamline BW2 (DORIS III)

Appears in the scientific report 2009
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Medline ; JCR ; No Author Disambiguation ; No Authors Fulltext ; Thomson Reuters Master Journal List ; Web of Science Core Collection
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 Record created 2012-09-19, last modified 2025-07-31


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