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@ARTICLE{Zolotaryov:93865,
      author       = {Zolotaryov, A. and Schramm, A. and Heyn, Ch. and Zozulya,
                      A. and Hansen, W. and DESY},
      title        = {{C}haracterisation of droplet-epitaxial
                      {G}a{A}s/{A}l{G}a{A}s quantum dot and quantum ring systems
                      using grazing incidence {X}-ray diffraction},
      journal      = {Materials science in semiconductor processing},
      volume       = {12},
      issn         = {1369-8001},
      address      = {Amsterdam [u.a.]},
      publisher    = {Elsevier Science},
      reportid     = {PHPPUBDB-12590},
      pages        = {75},
      year         = {2009},
      note         = {© Elsevier Ltd.; Post referee fulltext in progress 2;
                      Embargo 12 months from publication},
      month         = {Apr},
      date          = {2008-04-21},
      organization  = {7th International Workshop on
                       Epitaxial Semiconductors on Patterned
                       Substrates and Novel Index Surfaces,
                       Marseille (France), 21 Apr 2008 - 24
                       Apr 2008},
      cin          = {HASYLAB(-2012)},
      ddc          = {530},
      cid          = {$I:(DE-H253)HASYLAB_-2012_-20130307$},
      pnm          = {DORIS Beamline BW2 (POF1-550)},
      pid          = {G:(DE-H253)POF1-BW2-20130405},
      experiment   = {EXP:(DE-H253)D-BW2-20150101},
      typ          = {PUB:(DE-HGF)16},
      UT           = {WOS:000272821900016},
      doi          = {10.1016/j.mssp.2009.07.009},
      url          = {https://bib-pubdb1.desy.de/record/93865},
}