TY  - JOUR
AU  - Zolotaryov, A.
AU  - Schramm, A.
AU  - Heyn, Ch.
AU  - Zozulya, A.
AU  - Hansen, W.
AU  - DESY
TI  - Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction
JO  - Materials science in semiconductor processing
VL  - 12
SN  - 1369-8001
CY  - Amsterdam [u.a.]
PB  - Elsevier Science
M1  - PHPPUBDB-12590
SP  - 75
PY  - 2009
N1  - © Elsevier Ltd.; Post referee fulltext in progress 2; Embargo 12 months from publication
T2  - 7th International Workshop on Epitaxial Semiconductors on Patterned Substrates and Novel Index Surfaces
CY  - 21 Apr 2008 - 24 Apr 2008, Marseille (France)
Y2  - 21 Apr 2008 - 24 Apr 2008
M2  - Marseille, France
LB  - PUB:(DE-HGF)16
UR  - <Go to ISI:>//WOS:000272821900016
DO  - DOI:10.1016/j.mssp.2009.07.009
UR  - https://bib-pubdb1.desy.de/record/93865
ER  -