%0 Journal Article
%A Zolotaryov, A.
%A Schramm, A.
%A Heyn, Ch.
%A Zozulya, A.
%A Hansen, W.
%A DESY
%T Characterisation of droplet-epitaxial GaAs/AlGaAs quantum dot and quantum ring systems using grazing incidence X-ray diffraction
%J Materials science in semiconductor processing
%V 12
%@ 1369-8001
%C Amsterdam [u.a.]
%I Elsevier Science
%M PHPPUBDB-12590
%P 75
%D 2009
%Z © Elsevier Ltd.; Post referee fulltext in progress 2; Embargo 12 months from publication
%B 7th International Workshop on Epitaxial Semiconductors on Patterned Substrates and Novel Index Surfaces
%C 21 Apr 2008 - 24 Apr 2008, Marseille (France)
Y2 21 Apr 2008 - 24 Apr 2008
M2 Marseille, France
%F PUB:(DE-HGF)16
%9 Journal Article
%U <Go to ISI:>//WOS:000272821900016
%R 10.1016/j.mssp.2009.07.009
%U https://bib-pubdb1.desy.de/record/93865