X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids

Heighway, Patrick; Hwang, H.; Volz, T. J.; Kim, J.; Norton, A.-M.; Descamps, A.; Higginbotham, A.; Ranjan, D.; Coleman, A. L.; Edwards, C.; Comley, A. J.; Chantel, J.; Spindloe, C.; Nakatsutsumi, M.; Peake, D. J.; Sollier, A.; Coppari, F.; Hartley, N. J.; Belonoshko, A. B.; Errandonea, D.; Smith, R. F.; Cerantola, V.; Bolme, C. A.; Gorman, M. G.; Gonzalez, J. M.; Vinci, T.; Smith, J.; Tschentscher, Thomas; McGonegle, D.; McBride, E. E.; Suer, T.-A.; Savage, D. J.; Laso Garcia, A.; McMahon, Malcolm; Schoelmerich, M.; McHardy, J. D.; Banerjee, S.; Cowan, T. E.; Briggs, R.; Fiquet, G.; Nguyen-Cong, K.; Masruri, M.; Otzen, Christoph; Wark, J. S.; Vogel, S. C.; Armstrong, M. R.; Preston, T.; Ravasio, A.; Di Dio Cafiso, S.; Vennari, C. E.; Hernandez-Gomez, C.; Buakor, K.; Singh, S.; Koester, P.; Prescher, Clemens; Collins, G.; Antonelli, L.; Ali, S. J.; Mason, P.; Spear, J.; Dwivedi, A.; Humphries, O. S.; Randolph, L.; Phillips, J. P.; Gizzi, L.; Trapananti, A.; Tang, M.; Strohm, C.; Di Cicco, A.; Cynn, H.; Pandolfi, S.; Goede, S.; Merkel, Sebastien; Hutchinson, T. M.; Collier, J.; Albertazzi, B.; McGuire, C.; Willman, J. T.; Toncian, T.; Morard, Guillaume; Santamaria-Perez, D.; Ozaki, N.; Tracy, S. J.; Galtier, E.; Höppner, H.; McWilliams, R. S.; Toncian, M.; Rips, J.; Pereira, K. A.; Kraus, D.; Husband, R. J.; Dorchies, F.; Eggert, J. H.; Bouffetier, V.; Gleason, A.; Lee, Y.; Oleynik, I. I.; Konopkova, Z.; Labate, L.; Pelka, A.; Harmand, M.; Nagler, B.; Duff, M. J.; Stevens, T.; Ginestet, H.; Butcher, T.; Appel, Karen; Tyldesley, M.; Lazicki, A. E.; Zastrau, U.; Stevenson, M.; Vorberger, J.; Massani, B.; Keen, D. A.; Brambrink, E.; Wollenweber, L.; Krygier, A.; Baehtz, C.; Schwinkendorf, J.-P.; Liermann, H.-P.; Ball, O. B.; Cristoforetti, G.

doi:10.1063/5.0295250

Journal Article

PUBDB-2026-00244

X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids

Heighway, P. (Corresponding author)Extern*XFEL.EU* ; Peake, D. J. ; Stevens, T. ; Wark, J. S. ; Albertazzi, B. ; Ali, S. J. ; Antonelli, L. ; Armstrong, M. R. ; Baehtz, C. ; Ball, O. B. ; Banerjee, S. ; Belonoshko, A. B. ; Bolme, C. A. ; Bouffetier, V. ; Briggs, R. ; Buakor, K. ; Butcher, T. ; Di Dio Cafiso, S. ; Cerantola, V. ; Chantel, J. ; Di Cicco, A. ; Coleman, A. L. ; Collier, J. ; Collins, G. ; Comley, A. J. ; Coppari, F. ; Cowan, T. E. ; Cristoforetti, G. ; Cynn, H. ; Descamps, A. ; Dorchies, F. ; Duff, M. J. ; Dwivedi, A. ; Edwards, C. ; Eggert, J. H. ; Errandonea, D. ; Fiquet, G. ; Galtier, E. ; Laso Garcia, A. ; Ginestet, H. ; Gizzi, L. ; Gleason, A. ; Goede, S. ; Gonzalez, J. M. ; Gorman, M. G. ; Harmand, M. ; Hartley, N. J. ; Hernandez-Gomez, C. ; Higginbotham, A. ; Höppner, H. ; Humphries, O. S. ; Husband, R. J.XFEL.EU*DESY* ; Hutchinson, T. M. ; Hwang, H.Extern*XFEL.EU* ; Keen, D. A. ; Kim, J. ; Koester, P. ; Konopkova, Z. ; Kraus, D. ; Krygier, A. ; Labate, L. ; Lazicki, A. E. ; Lee, Y. ; Liermann, H.-P.XFEL.EU*DESY* ; Mason, P. ; Masruri, M. ; Massani, B. ; McBride, E. E.Extern* ; McGuire, C. ; McHardy, J. D. ; McGonegle, D. ; McWilliams, R. S. ; Merkel, S.Extern* ; Morard, G.Extern* ; Nagler, B. ; Nakatsutsumi, M. ; Nguyen-Cong, K. ; Norton, A.-M. ; Oleynik, I. I. ; Otzen, C.Extern*XFEL.EU* ; Ozaki, N. ; Pandolfi, S. ; Pelka, A. ; Pereira, K. A. ; Phillips, J. P. ; Prescher, C.Extern* ; Preston, T. ; Randolph, L. ; Ranjan, D. ; Ravasio, A. ; Rips, J. ; Santamaria-Perez, D. ; Savage, D. J. ; Schoelmerich, M. ; Schwinkendorf, J.-P. ; Singh, S. ; Smith, J. ; Smith, R. F. ; Sollier, A. ; Spear, J. ; Spindloe, C. ; Stevenson, M. ; Strohm, C.XFEL.EU*DESY* ; Suer, T.-A. ; Tang, M. ; Toncian, M. ; Toncian, T. ; Tracy, S. J. ; Trapananti, A. ; Tschentscher, T.XFEL.EU* ; Tyldesley, M. ; Vennari, C. E. ; Vinci, T. ; Vogel, S. C. ; Volz, T. J. ; Vorberger, J. ; Willman, J. T. ; Wollenweber, L. ; Zastrau, U. ; Brambrink, E. ; Appel, K.XFEL.EU* ; McMahon, M.Extern*

2025
American Inst. of Physics Melville, NY

Journal of applied physics 138(15), 155903 (2025) [10.1063/5.0295250]

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Please use a persistent id in citations: doi:10.1063/5.0295250 doi:10.3204/PUBDB-2026-00244

Abstract: We present a model of x-ray thermal diffuse scattering (TDS) from a cubic polycrystal with an arbitrary crystallographic texture, based on the classic approach of Warren [B. E. Warren, Acta Crystallogr. 6, 803 (1953)]. We compare the predictions of our model with femtosecond x-ray diffraction patterns gathered from ambient and dynamically compressed rolled copper foils obtained at the High Energy Density instrument of the European X-Ray Free-Electron Laser facility and find that the texture-aware TDS model yields more accurate results than does the conventional powder model owed to Warren. Nevertheless, we further show: with sufficient angular detector coverage, the TDS signal is largely unchanged by sample orientation and in all cases strongly resembles the signal from a perfectly random powder; shot-to-shot fluctuations in the TDS signal resulting from grain-sampling statistics are at the percent level, in stark contrast to the fluctuations in the Bragg-peak intensities (which are over an order of magnitude greater); and TDS is largely unchanged even following texture evolution caused by compression-induced plastic deformation. We conclude that TDS is robust against texture variation, making it a flexible temperature diagnostic applicable just as well to off-the-shelf commercial foils as to ideal powders.

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ddc:530

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PETRA Beamline P02.2 (PETRA III)

Appears in the scientific report 2025

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