Contribution to a conference proceedings/Contribution to a book

PUBDB-2025-04726

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Single-shot detection of short electron bunch shapes at MHz repetition rates using diversity electro-optic scheme with advanced reconstruction algorithms at EuXFEL and FLASH

Demazeux, Q. (Corresponding author)Extern* ; Szwaj, C.Extern* ; Roussel, E.Extern* ; Steffen, B.DESY* ; Czwalinna, M. K.DESY* ; Bielawski, S.Extern*

2026
JACoW Publishing Geneva
ISBN: 978-3-95450-262-2

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Please use a persistent id in citations: doi:10.18429/JACoW-IBIC2025-WEPMO13  doi:10.3204/PUBDB-2025-04726

Abstract: To surpass limitations in sub-picosecond electro-optic electron bunch length diagnostics[1], we present an innovative detection method utilizing diversity schemes[2]. This approach employs simultaneous multi-output measurements of the chirped optical probe modulated by the electron bunch's field. We introduce a novel inversion algorithm that automatically recognizes and compensates for imperfections in the probe laser spectrum and chirp, enabling high-fidelity retrieval of bunch shapes, particularly for broadband THz radiation over a long temporal window. Numerical simulations and initial experimental results demonstrate the system's potential for advanced, real-time bunch shape monitors at FLASH and EuXFEL, and can be extended to THz CTR or FEL based THz sources. [1] F. Sun, Z. Jiang, and X.-C. Zhang, Appl. Phys. Lett. 3, 2233 (1998) [2] E. Roussel et al., Light: Science & Applications 11, 14 (2022)

Keyword(s): Accelerator Physics ; MC05 - MC05: Longitudinal Diagnostics and Synchronization

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Contributing Institute(s):

1. Strahlkontrollen (MSK)

Research Program(s):

1. 621 - Accelerator Research and Development (POF4-621) (POF4-621)

Experiment(s):

1. Facility (machine) FLASH
2. Facility (machine) XFEL

Appears in the scientific report 2026

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