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@INPROCEEDINGS{Demazeux:640176,
      author       = {Demazeux, Quentin and Szwaj, Christophe and Roussel,
                      Eléonore and Steffen, Bernd and Czwalinna, Marie Kristin
                      and Bielawski, Serge},
      title        = {{S}ingle-shot detection of short electron bunch shapes at
                      {MH}z repetition rates using diversity electro-optic scheme
                      with advanced reconstruction algorithms at {E}u{XFEL} and
                      {FLASH}},
      address      = {Geneva},
      publisher    = {JACoW Publishing},
      reportid     = {PUBDB-2025-04726},
      isbn         = {978-3-95450-262-2},
      pages        = {746 - 748},
      year         = {2026},
      comment      = {The Fourteenth International Beam Instrumentation
                      Conference : Liverpool, UK, 7-11 September 2025 : full
                      proceedings},
      booktitle     = {The Fourteenth International Beam
                       Instrumentation Conference : Liverpool,
                       UK, 7-11 September 2025 : full
                       proceedings},
      abstract     = {To surpass limitations in sub-picosecond electro-optic
                      electron bunch length diagnostics[1], we present an
                      innovative detection method utilizing diversity schemes[2].
                      This approach employs simultaneous multi-output measurements
                      of the chirped optical probe modulated by the electron
                      bunch's field. We introduce a novel inversion algorithm that
                      automatically recognizes and compensates for imperfections
                      in the probe laser spectrum and chirp, enabling
                      high-fidelity retrieval of bunch shapes, particularly for
                      broadband THz radiation over a long temporal window.
                      Numerical simulations and initial experimental results
                      demonstrate the system's potential for advanced, real-time
                      bunch shape monitors at FLASH and EuXFEL, and can be
                      extended to THz CTR or FEL based THz sources. [1] F. Sun, Z.
                      Jiang, and X.-C. Zhang, Appl. Phys. Lett. 3, 2233 (1998) [2]
                      E. Roussel et al., Light: Science $\&$ Applications 11, 14
                      (2022)},
      month         = {Sep},
      date          = {2025-09-07},
      organization  = {14th International Beam
                       Instrumentation Conference, Liverpool
                       (UK), 7 Sep 2025 - 11 Sep 2025},
      keywords     = {Accelerator Physics (Other) / MC05 - MC05: Longitudinal
                      Diagnostics and Synchronization (Other)},
      cin          = {MSK},
      cid          = {I:(DE-H253)MSK-20120731},
      pnm          = {621 - Accelerator Research and Development (POF4-621)},
      pid          = {G:(DE-HGF)POF4-621},
      experiment   = {EXP:(DE-H253)FLASH(machine)-20150101 /
                      EXP:(DE-H253)XFEL(machine)-20150101},
      typ          = {PUB:(DE-HGF)8 / PUB:(DE-HGF)7},
      doi          = {10.18429/JACoW-IBIC2025-WEPMO13},
      url          = {https://bib-pubdb1.desy.de/record/640176},
}