Journal Article/Contribution to a conference proceedings/Contribution to a book

PUBDB-2025-01109

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Multilayer Laue Lenses for focusing XFEL beams

Zakharova, M. (First author)CFEL*DESY* ; Wong, J. C.CFEL* ; Prasciolu, M.CFEL*XFEL.EU*DESY* ; Dresselhaus, J. L.CFEL*Extern* ; Fleckenstein, H.CFEL*XFEL.EU*DESY* ; Chapman, H. N.CFEL*XFEL.EU*DESY* ; Bajt, S. (Corresponding author)CFEL*XFEL.EU*DESY*

2025
SPIE Bellingham, Wash.

This record in other databases:  

Please use a persistent id in citations: doi:10.1117/12.3057178

Abstract: X-ray optical elements in X-ray Free Electron Laser (XFEL) applications experience high thermal loads. Whilereflective optics can spread the incident beam over a larger area to reduce heating, refractive and diffractiveoptics must mitigate this by minimizing X-ray absorption, which necessitates the use of low atomic numbermaterials. To address this challenge, we evaluated various multilayer material pairs and identified Mo2C/SiCas the optimal choice due to its superior diffraction efficiency and thermal stability. Here, we present the novelwedged multilayer Laue lenses (MLLs) which were successfully used to focus XFEL beams at the European XFEL.A lens pair fabricated from the same Mo2C/SiC multilayer of 100 µm deposited thickness was characterized beforeand after XFEL experiment using a laboratory-based X-ray setup. The MLLs maintained stable performancethroughout a week-long XFEL beamtime, with no observed degradation in focusing performance or structuralintegrity. These results demonstrate the robustness and suitability of MLLs for high-intensity X-ray applications.

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Contributing Institute(s):

1. FS-Arbeitsgruppe (FS-ML)
2. FS-CFEL-1 (Group Leader: Henry Chapman) (CFEL-I)

Research Program(s):

1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)
2. AIM, DFG project G:(GEPRIS)390715994 - EXC 2056: CUI: Advanced Imaging of Matter (390715994) (390715994)

Experiment(s):

1. Experiments at XFEL

Appears in the scientific report 2025

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Database coverage:
; National-Konsortium ; SCOPUS

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