Journal Article PUBDB-2024-02000

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Unveiling nano-scale chemical inhomogeneity in surface oxide films formed on V- and N-containing martensite stainless steel by synchrotron X-ray photoelectron emission spectroscopy/microscopy and microscopic X-ray absorption spectroscopy

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2024
Ed. Board, Journal of Materials Science & Technology Shenyang

Journal of materials science & technology 205, 191-203 () [10.1016/j.jmst.2024.04.006]
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Abstract: Nano-scale chemical inhomogeneity in surface oxide films formed on a V- and N-containing martensite stainless steel and tempering heating induced changes are investigated by a combination of synchrotron- based hard X-ray Photoelectron emission spectroscopy (HAXPES) and microscopy (HAXPEEM) as well as microscopic X-ray absorption spectroscopy (μ-XAS) techniques. The results reveal the inhomogene- ity in the oxide films on the micron-sized Cr$_2$ N- and VN-type particles, while the inhomogeneity on the martensite matrix phase exists due to localised formation of nano-sized tempering nitride particles at 600 °C. The oxide film formed on Cr$_2$ N-type particles is rich in Cr$_2$O$_2$ compared with that on the martensite matrix and VN-type particles. With the increase of tempering temperature, Cr$_2$O$_2$ formation is faster for the oxidation of Cr in the martensite matrix than the oxidation of Cr nitride-rich particles.

Classification:

Contributing Institute(s):
  1. Nanolab (FS-NL)
  2. Experimentebetreuung PETRA III (FS-PET-S)
Research Program(s):
  1. 632 - Materials – Quantum, Complex and Functional Materials (POF4-632) (POF4-632)
  2. 6G3 - PETRA III (DESY) (POF4-6G3) (POF4-6G3)
  3. NEP - Nanoscience Foundries and Fine Analysis - Europe|PILOT (101007417) (101007417)
Experiment(s):
  1. PETRA Beamline P22 (PETRA III)
  2. DESY NanoLab: Microscopy

Appears in the scientific report 2024
Database coverage:
Medline ; Creative Commons Attribution CC BY 4.0 ; OpenAccess ; Clarivate Analytics Master Journal List ; Current Contents - Electronics and Telecommunications Collection ; Current Contents - Engineering, Computing and Technology ; Essential Science Indicators ; IF >= 10 ; JCR ; NationallizenzNationallizenz ; SCOPUS ; Science Citation Index Expanded ; Web of Science Core Collection
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Private Collections > >DESY > >FS > FS-NL
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 Record created 2024-06-04, last modified 2025-07-24


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