Journal Article

PUBDB-2023-01816

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png The HARE chip for efficient time-resolved serial synchrotron crystallography

Mehrabi, P.CFEL*MPG*Extern* ; Müller-Werkmeister, H. M.Extern*EMBL* ; Leimkohl, J.-P.CFEL*MPG* ; Schikora, H.CFEL*MPG* ; Ninkovic, J. ; Krivokuca, S. ; Andriček, L. ; Epp, S. W.CFEL*MPG* ; Sherrell, D.Extern*XFEL.EU* ; Owen, R. L.Extern*XFEL.EU* ; Pearson, A. R.Extern*XFEL.EU*EMBL* ; Tellkamp, F.CFEL*MPG* ; Schulz, E. (Corresponding author)Extern* ; Miller, R. J. D. (Corresponding author)CFEL*MPG*

2020
Wiley-Blackwell [Erscheinungsort nicht ermittelbar]

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Please use a persistent id in citations: doi:10.1107/S1600577520000685  doi:10.3204/PUBDB-2023-01816

Abstract: Serial synchrotron crystallography (SSX) is an emerging technique for static and time-resolved protein structure determination. Using specifically patterned silicon chips for sample delivery, the `hit-and-return' (HARE) protocol allows for efficient time-resolved data collection. The specific pattern of the crystal wells in the HARE chip provides direct access to many discrete time points. HARE chips allow for optical excitation as well as on-chip mixing for reaction initiation, making a large number of protein systems amenable to time-resolved studies. Loading of protein microcrystals onto the HARE chip is streamlined by a novel vacuum loading platform that allows fine-tuning of suction strength while maintaining a humid environment to prevent crystal dehydration. To enable the widespread use of time-resolved serial synchrotron crystallography (TR-SSX), detailed technical descriptions of a set of accessories that facilitate TR-SSX workflows are provided.

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Contributing Institute(s):

1. DOOR-User (DOOR ; HAS-User)
2. MPSD (CFEL-SSUMP)
3. SSU for Ultrafast Beam Applications (CFEL-SSUUB)
4. beauftragt von UNI (UNI/CUI)

Research Program(s):

1. 6G3 - PETRA III (DESY) (POF4-6G3) (POF4-6G3)
2. DFG project G:(GEPRIS)194651731 - EXC 1074: Hamburger Zentrum für ultraschnelle Beobachtung (CUI): Struktur, Dynamik und Kontrolle von Materie auf atomarer Skala (194651731) (194651731)

Experiment(s):

1. PETRA Beamline P14 (PETRA III)

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Database coverage:
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