Home > Publications database > Culling a self-assembled quantum dot as a single-photon source using X-ray microscopy |
Journal Article | PUBDB-2022-05258 |
; ; ; ; ; ; ; ; ;
2023
Soc.
Washington, DC
This record in other databases:
Please use a persistent id in citations: doi:10.1021/acsnano.3c04835 doi:10.3204/PUBDB-2022-05258
Abstract: Epitaxially grown self-assembled semiconductor quantum dots (QDs) with atom-like optical properties, have emerged as the best choice for single photon sources required for the development of quantum technology and quantum networks. Nondestructive selection of a single QD having desired structural, compositional, and optical characteristics is essential to obtain noise-free, fully indistinguishable single or entangled photons out of single-photon emitters. Here, we show that the structural-orientations and local compositional-inhomogeneities within a single QD and the surrounding wet-layer can be probed in a screening fashion by scanning X-ray diffraction microscopy (SXDM) and X-ray fluorescence (XRF) with a few tens of nanometers-sized synchrotron radiation-beam. The presented measurement protocol can be used to cull the best single QD from the enormous number of self-assembled dots grown simultaneously. The results obtained show that the elemental composition and resultant strain profiles of a QD are sensitive to in-plane crystallographic directions. We also observe that lattice expansion after a certain composition-limit introduces shear strain within a QD, enabling the possibility of controlled chiral-QD formation. Nanoscale-chirality and compositional-anisotropy, contradictory to common assumption, need to be incorporated into existing theoretical models to predict the optical properties of single-photon sources and to further tune the epitaxial growth process of self-assembled quantum structures.
![]() |
The record appears in these collections: |